MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /
Includes bibliographical and references
| Egile Nagusiak: | , , , |
|---|---|
| Formatua: | |
| Hizkuntza: | eng |
| Argitaratua: |
Hoboken, New Jersey : John Wiley & Sons, Inc. ;
2021
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| Gaiak: |