MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

MACHINE VISION INSPECTION SYSTEMS. Volume 2 : Machine Learning-Based Approaches /

Includes bibliographical and references

Bibliografische gegevens
Hoofdauteurs: Malarvel, Muthukumaran, editor, Nayak, Soumya Ranjan, 1984-, editor, Pattnaik, Prasant Kumar, 1969-, editor, Panda, Surya Narayan, editor
Formaat:
Taal:eng
Gepubliceerd in: Hoboken, New Jersey : John Wiley & Sons, Inc. ; 2021
Onderwerpen:
Computer vision
Engineering inspection
Image processing

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