Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /

Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing /

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Bibliographic Details
Main Author:	Arbab Alamgir, 1991-, author 604435
Format:	software, multimedia
Language:	eng
Published:	Johor Bahru, Johor : Universiti Teknologi Malaysia, 2022
Subjects:	Electronic circuit design

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