Advanced Laser Diode Reliability /
Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar detail...
| Main Authors: | , , , , |
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| Format: | software, multimedia |
| Language: | eng |
| Published: |
San Diego : ISTE Press-Elsevier,
2021
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| Subjects: | |
| Online Access: | https://www.sciencedirect.com/science/book/9781785481543 |
| _version_ | 1796765146752745472 |
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| author | Vanzi, Massimo, editor 651523 Béchou, Laurent, editor 651524 Fukuda, Mitsuo, editor 651525 Mura, Giovanna, editor 651526 ScienceDirect (Online service) 7722 |
| author_facet | Vanzi, Massimo, editor 651523 Béchou, Laurent, editor 651524 Fukuda, Mitsuo, editor 651525 Mura, Giovanna, editor 651526 ScienceDirect (Online service) 7722 |
| author_sort | Vanzi, Massimo, editor 651523 |
| collection | OCEAN |
| description | Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction. |
| first_indexed | 2024-03-05T17:20:06Z |
| format | software, multimedia |
| id | KOHA-OAI-TEST:606508 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-05T17:20:06Z |
| publishDate | 2021 |
| publisher | San Diego : ISTE Press-Elsevier, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:6065082023-10-19T04:16:21ZAdvanced Laser Diode Reliability / Vanzi, Massimo, editor 651523 Béchou, Laurent, editor 651524 Fukuda, Mitsuo, editor 651525 Mura, Giovanna, editor 651526 ScienceDirect (Online service) 7722 software, multimedia Electronic books 631902 San Diego : ISTE Press-Elsevier,©20212021engAdvanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.Includes bibliographical references and index1. Laser Diode Reliability -- 2. Multi-Component Model for Semiconductor Laser Degradation -- 3. Reliability of Laser Diodes for High-rate Optical Communications – A Monte Carlo-based Method to Predict Lifetime Distributions and Failure Rates in Operating Condition -- 4. Laser Diode Characteristics -- 5. Laser Diode DC Measurement Protocols -- Introduction to Appendix -- Appendix - The Rules of the Rue Morgue.Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.Diodes, Semiconductorhttps://www.sciencedirect.com/science/book/9781785481543URN:ISBN:9781785481543Remote access restricted to users with a valid UTM ID via VPN. |
| spellingShingle | Diodes, Semiconductor Vanzi, Massimo, editor 651523 Béchou, Laurent, editor 651524 Fukuda, Mitsuo, editor 651525 Mura, Giovanna, editor 651526 ScienceDirect (Online service) 7722 Advanced Laser Diode Reliability / |
| title | Advanced Laser Diode Reliability / |
| title_full | Advanced Laser Diode Reliability / |
| title_fullStr | Advanced Laser Diode Reliability / |
| title_full_unstemmed | Advanced Laser Diode Reliability / |
| title_short | Advanced Laser Diode Reliability / |
| title_sort | advanced laser diode reliability |
| topic | Diodes, Semiconductor |
| url | https://www.sciencedirect.com/science/book/9781785481543 |
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