MATHEMATICAL MODELLING AND OPTIMIZATION OF MULTISITE EFFICIENCY TO REDUCE COST OF TEST IN SEMICONDUCTOR FINAL TEST PROCESS USING TAGUCHI METHOD /

MATHEMATICAL MODELLING AND OPTIMIZATION OF MULTISITE EFFICIENCY TO REDUCE COST OF TEST IN SEMICONDUCTOR FINAL TEST PROCESS USING TAGUCHI METHOD /

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Bibliographic Details
Main Authors: Khoo Voon Ching, 1974-, author 654412, Rozzeta Dolah, supervisor 186505, Habibah Haron, supervisor 610493, Puvanesvaran Gunalan, supervisor 654413, Fakulti Teknologi dan Informatik Razak 619091
Format: text
Language:eng
Published: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2021
Subjects:
Semiconductors
Taguchi methods (Quality control)

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