POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY /
| Main Authors: | , , , |
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| Format: | text |
| Language: | eng |
| Published: |
Johor Bahru, Johor : Universiti Teknologi Malaysia,
2017
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| _version_ | 1826473488324493312 |
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| author | Mahshid Mojtabavi Naeini, author 654554 Ooi, Chia Yee, supervisor 486773 Sreedharan Baskara Dass, supervisor 638204 Fakulti Teknologi dan Informatik Razak 619091 |
| author_facet | Mahshid Mojtabavi Naeini, author 654554 Ooi, Chia Yee, supervisor 486773 Sreedharan Baskara Dass, supervisor 638204 Fakulti Teknologi dan Informatik Razak 619091 |
| author_sort | Mahshid Mojtabavi Naeini, author 654554 |
| collection | OCEAN |
| description | |
| first_indexed | 2024-07-04T04:50:45Z |
| format | text |
| id | KOHA-OAI-TEST:611176 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-09-23T23:42:43Z |
| publishDate | 2017 |
| publisher | Johor Bahru, Johor : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:6111762024-09-17T09:04:44ZPOWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / Mahshid Mojtabavi Naeini, author 654554 Ooi, Chia Yee, supervisor 486773 Sreedharan Baskara Dass, supervisor 638204 Fakulti Teknologi dan Informatik Razak 619091 textJohor Bahru, Johor : Universiti Teknologi Malaysia, 2017engIncludes bibliographyKK-FTIR |
| spellingShingle | Mahshid Mojtabavi Naeini, author 654554 Ooi, Chia Yee, supervisor 486773 Sreedharan Baskara Dass, supervisor 638204 Fakulti Teknologi dan Informatik Razak 619091 POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title | POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title_full | POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title_fullStr | POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title_full_unstemmed | POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title_short | POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY / |
| title_sort | power minimization for scan based testing using low power integrated design for testability |
| work_keys_str_mv | AT mahshidmojtabavinaeiniauthor654554 powerminimizationforscanbasedtestingusinglowpowerintegrateddesignfortestability AT ooichiayeesupervisor486773 powerminimizationforscanbasedtestingusinglowpowerintegrateddesignfortestability AT sreedharanbaskaradasssupervisor638204 powerminimizationforscanbasedtestingusinglowpowerintegrateddesignfortestability AT fakultiteknologidaninformatikrazak619091 powerminimizationforscanbasedtestingusinglowpowerintegrateddesignfortestability |