POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY /

POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY /

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Bibliographic Details
Main Authors: Mahshid Mojtabavi Naeini, author 654554, Ooi, Chia Yee, supervisor 486773, Sreedharan Baskara Dass, supervisor 638204, Fakulti Teknologi dan Informatik Razak 619091
Format: text
Language:eng
Published: Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017

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