POWER MINIMIZATION FOR SCAN-BASED TESTING USING LOW-POWER INTEGRATED DESIGN-FOR-TESTABILITY - Mahshid Mojtabavi Naeini, author 654554; Ooi, Chia Yee, supervisor 486773; Sreedharan Baskara Dass, supervisor 638204; Fakulti Teknologi dan Informatik Razak 619091 (Johor Bahru, Johor : Universiti Teknologi Malaysia, 2017)