Random power supply as a test vector to expose soft defects in CMOS digital circuits /
Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000
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| Format: | |
| Language: | eng |
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Skudai : Universiti Teknologi Malaysia,
2000
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| _version_ | 1796658717058400256 |
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| author | 271915 Izam Kamisian |
| author_facet | 271915 Izam Kamisian |
| author_sort | 271915 Izam Kamisian |
| collection | OCEAN |
| description | Thesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 2000 |
| first_indexed | 2024-03-04T15:52:40Z |
| format | |
| id | KOHA-OAI-TEST:68003 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| language | eng |
| last_indexed | 2024-03-04T15:52:40Z |
| publishDate | 2000 |
| publisher | Skudai : Universiti Teknologi Malaysia, |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:680032020-12-19T16:59:50ZRandom power supply as a test vector to expose soft defects in CMOS digital circuits / 271915 Izam Kamisian Skudai : Universiti Teknologi Malaysia,2000engThesis (Master in Electrical Engineering) - Universiti Teknologi Malaysia, 20001516FEELECTLPower resourcesElectric power productionIntegrated circuits |
| spellingShingle | Power resources Electric power production Integrated circuits 271915 Izam Kamisian Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title | Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title_full | Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title_fullStr | Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title_full_unstemmed | Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title_short | Random power supply as a test vector to expose soft defects in CMOS digital circuits / |
| title_sort | random power supply as a test vector to expose soft defects in cmos digital circuits |
| topic | Power resources Electric power production Integrated circuits |
| work_keys_str_mv | AT 271915izamkamisian randompowersupplyasatestvectortoexposesoftdefectsincmosdigitalcircuits |