In situ real-time characterization of thin films /
40
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出版: |
New York : John Wiley,
2001
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_version_ | 1826370943441698816 |
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author | Auciello, Orlando |
author_facet | Auciello, Orlando |
author_sort | Auciello, Orlando |
collection | OCEAN |
description | 40 |
first_indexed | 2024-03-04T16:26:30Z |
format | |
id | KOHA-OAI-TEST:79241 |
institution | Universiti Teknologi Malaysia - OCEAN |
last_indexed | 2024-03-04T16:26:30Z |
publishDate | 2001 |
publisher | New York : John Wiley, |
record_format | dspace |
spelling | KOHA-OAI-TEST:792412020-12-19T17:00:29ZIn situ real-time characterization of thin films / Auciello, Orlando New York : John Wiley,200140PSZJBLThin filmsURN:ISBN:0471241415 ( hbk.) |
spellingShingle | Thin films Auciello, Orlando In situ real-time characterization of thin films / |
title | In situ real-time characterization of thin films / |
title_full | In situ real-time characterization of thin films / |
title_fullStr | In situ real-time characterization of thin films / |
title_full_unstemmed | In situ real-time characterization of thin films / |
title_short | In situ real-time characterization of thin films / |
title_sort | in situ real time characterization of thin films |
topic | Thin films |
work_keys_str_mv | AT aucielloorlando insiturealtimecharacterizationofthinfilms |