X-Ray Topography

X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray...

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Main Authors: Hartwig, J. B., Hartwig, J., S. N., Aqida
Format: Book Chapter
Language:English
English
Published: Elsevier 2016
Subjects:
Online Access:http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf
http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf
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author Hartwig, J. B.
Hartwig, J.
S. N., Aqida
author_facet Hartwig, J. B.
Hartwig, J.
S. N., Aqida
author_sort Hartwig, J. B.
collection UMP
description X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials.
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spelling UMPir162242018-01-22T06:14:40Z http://umpir.ump.edu.my/id/eprint/16224/ X-Ray Topography Hartwig, J. B. Hartwig, J. S. N., Aqida TJ Mechanical engineering and machinery X-ray topography is a nondestructive technique to characterize strain and visualize inhomogeneties, imperfections, and distortions in crystals. This article presents X-ray topography fundamentals, basic technique, and simulation. In principle, the topographic information produced by diffracted X-ray beam when the Bragg condition is satisfied. Among the basic extended beam methods are integrated wave and plane wave topography. The integrated wave method includes white beam X-ray topography which is the Laue technique with low divergent, powerful, and broad incident beam. The advent of synchrotron radiation topography permits a fast and detailed study of defects in crystalline materials. Elsevier 2016 Book Chapter PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf application/pdf en http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf Hartwig, J. B. and Hartwig, J. and S. N., Aqida (2016) X-Ray Topography. In: Reference Module in Materials Science and Materials Engineering. Elsevier, Oxford, pp. 1-9. ISBN 978-0-12-803581-8 http://dx.doi.org/10.1016/B978-0-12-803581-8.01228-5 DOI: 10.1016/B978-0-12-803581-8.01228-5
spellingShingle TJ Mechanical engineering and machinery
Hartwig, J. B.
Hartwig, J.
S. N., Aqida
X-Ray Topography
title X-Ray Topography
title_full X-Ray Topography
title_fullStr X-Ray Topography
title_full_unstemmed X-Ray Topography
title_short X-Ray Topography
title_sort x ray topography
topic TJ Mechanical engineering and machinery
url http://umpir.ump.edu.my/id/eprint/16224/1/fkm-2016-aqida-xray.pdf
http://umpir.ump.edu.my/id/eprint/16224/7/fkm-2016-X-Ray%20Topography.pdf
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