Effect of image compression using fast fourier transformation and discrete wavelet transformation on transfer learning wafer defect image classification
Automated inspection machines for wafer defects usually captured thousands of images on a large scale to preserve the detail of defect features. However, most transfer learning architecture requires smaller images as input images. Thus, proper compression is required to preserve the defect features...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penerbit UMP
2020
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| Subjects: | |
| Online Access: | http://umpir.ump.edu.my/id/eprint/33607/1/Effect%20of%20image%20compression%20using%20fast%20fourier%20transformation.pdf |