Evaluation of the Transfer Learning Models in Wafer Defects Classification
In a semiconductor industry, wafer defect detection has becoming ubiquitous. Various machine learning algorithms had been adopted to be the “brain” behind the machine for reliable, fast defect detection. Transfer Learning is one of the common methods. Various algorithms under Transfer Learning had b...
| Main Authors: | , , , , , |
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| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
Springer Nature
2022
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| Subjects: | |
| Online Access: | http://umpir.ump.edu.my/id/eprint/36763/1/Evaluation%20of%20the%20Transfer%20Learning%20Models%20in%20Wafer%20Defects%20Classification%20%281%29.pdf |