Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate

Due to environmental concern, lead-free solder are taking the place of eutectic Sn-Pb solder in electronic packaging industry. Among various lead free alloys, Sn–Ag–Cu (SAC) alloys are leading lead-free candidate solders for various applications because it is offered better properties. This study in...

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Main Authors: Siti Rabiatull Aisha, Idris, Saliza Azlina, Osman, Ali, Ourdjini
Format: Article
Language:English
Published: Trans Tech Publications, Switzerland 2012
Subjects:
Online Access:http://umpir.ump.edu.my/id/eprint/5192/2/AMR.488-489.1375_from_kak_Ija_2012.pdf
_version_ 1825821624235982848
author Siti Rabiatull Aisha, Idris
Saliza Azlina, Osman
Ali, Ourdjini
author_facet Siti Rabiatull Aisha, Idris
Saliza Azlina, Osman
Ali, Ourdjini
author_sort Siti Rabiatull Aisha, Idris
collection UMP
description Due to environmental concern, lead-free solder are taking the place of eutectic Sn-Pb solder in electronic packaging industry. Among various lead free alloys, Sn–Ag–Cu (SAC) alloys are leading lead-free candidate solders for various applications because it is offered better properties. This study investigates the interfacial reactions during reflow soldering and isothermal aging between Sn-3.0Ag-0.5Cu (SAC305) and Sn-3.0Ag-0.5Cu-0.05Ni (SACN30505) on electroless nickel/immersion palladium/immersion gold (ENEPIG) surface finish. The substrates were subjected to isothermal aging at 125˚C for up to 2000 hours with solder size diameter of 500µm. The results indicated that after reflow soldering, (Cu, Ni)6Sn5 IMC is formed between solder and substrate while after aging treatment a new IMC was formed between (Cu, Ni)6Sn5 and substrate known as (Ni, Cu)3Sn4. Moreover, after soldering and isothermal aging, Ni-doped (SACN) solder represents a thicker IMC compared to SAC solder. Aging time of solder joints results in an increase of IMC’s thickness and changes their morphologies to become more spherical, dense and with larger grain size. In addition, the results also revealed that the thickness of intermetallics formed is proportional to the aging duration.
first_indexed 2024-03-06T11:44:21Z
format Article
id UMPir5192
institution Universiti Malaysia Pahang
language English
last_indexed 2024-03-06T11:44:21Z
publishDate 2012
publisher Trans Tech Publications, Switzerland
record_format dspace
spelling UMPir51922018-01-15T08:18:19Z http://umpir.ump.edu.my/id/eprint/5192/ Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate Siti Rabiatull Aisha, Idris Saliza Azlina, Osman Ali, Ourdjini TN Mining engineering. Metallurgy Due to environmental concern, lead-free solder are taking the place of eutectic Sn-Pb solder in electronic packaging industry. Among various lead free alloys, Sn–Ag–Cu (SAC) alloys are leading lead-free candidate solders for various applications because it is offered better properties. This study investigates the interfacial reactions during reflow soldering and isothermal aging between Sn-3.0Ag-0.5Cu (SAC305) and Sn-3.0Ag-0.5Cu-0.05Ni (SACN30505) on electroless nickel/immersion palladium/immersion gold (ENEPIG) surface finish. The substrates were subjected to isothermal aging at 125˚C for up to 2000 hours with solder size diameter of 500µm. The results indicated that after reflow soldering, (Cu, Ni)6Sn5 IMC is formed between solder and substrate while after aging treatment a new IMC was formed between (Cu, Ni)6Sn5 and substrate known as (Ni, Cu)3Sn4. Moreover, after soldering and isothermal aging, Ni-doped (SACN) solder represents a thicker IMC compared to SAC solder. Aging time of solder joints results in an increase of IMC’s thickness and changes their morphologies to become more spherical, dense and with larger grain size. In addition, the results also revealed that the thickness of intermetallics formed is proportional to the aging duration. Trans Tech Publications, Switzerland 2012-03-15 Article PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/5192/2/AMR.488-489.1375_from_kak_Ija_2012.pdf Siti Rabiatull Aisha, Idris and Saliza Azlina, Osman and Ali, Ourdjini (2012) Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate. Advanced Materials Research, 488-48. pp. 1375-1379. ISSN 1022-6680 (print), 1662-8985 (online). (Published) http://dx.doi.org/10.4028/www.scientific.net/AMR.488-489.1375 DOI: 10.4028/www.scientific.net/AMR.488-489.1375
spellingShingle TN Mining engineering. Metallurgy
Siti Rabiatull Aisha, Idris
Saliza Azlina, Osman
Ali, Ourdjini
Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title_full Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title_fullStr Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title_full_unstemmed Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title_short Effect of Nickel Doping on Interfacial Reaction between Lead-free Solder and Ni-P Substrate
title_sort effect of nickel doping on interfacial reaction between lead free solder and ni p substrate
topic TN Mining engineering. Metallurgy
url http://umpir.ump.edu.my/id/eprint/5192/2/AMR.488-489.1375_from_kak_Ija_2012.pdf
work_keys_str_mv AT sitirabiatullaishaidris effectofnickeldopingoninterfacialreactionbetweenleadfreesolderandnipsubstrate
AT salizaazlinaosman effectofnickeldopingoninterfacialreactionbetweenleadfreesolderandnipsubstrate
AT aliourdjini effectofnickeldopingoninterfacialreactionbetweenleadfreesolderandnipsubstrate