Test Data Generation for Event Driven System Using Bees Algorithm

For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems,...

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Main Authors: Mohammed Zabil, Mohd H., Kamal Z., Zamli
Format: Conference or Workshop Item
Language:English
Published: 2013
Subjects:
Online Access:http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf
_version_ 1825821853130686464
author Mohammed Zabil, Mohd H.
Kamal Z., Zamli
author_facet Mohammed Zabil, Mohd H.
Kamal Z., Zamli
author_sort Mohammed Zabil, Mohd H.
collection UMP
description For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems, sequence of inputs produce significant results to how such system process the inputs and produce the output. For these types of systems, fault might be triggered from a particular order of the input sequence, entered or given to the system. . In this paper we discuss and proposed a new strategy for generating test data for event-driven system using a bio inspired artificial intelligent, namely Bees Algorithm (BA). We discussed the implementation of BA and benchmark it with the existing approaches.
first_indexed 2024-03-06T11:47:48Z
format Conference or Workshop Item
id UMPir6942
institution Universiti Malaysia Pahang
language English
last_indexed 2024-03-06T11:47:48Z
publishDate 2013
record_format dspace
spelling UMPir69422018-01-16T01:43:23Z http://umpir.ump.edu.my/id/eprint/6942/ Test Data Generation for Event Driven System Using Bees Algorithm Mohammed Zabil, Mohd H. Kamal Z., Zamli QA75 Electronic computers. Computer science For an event driven system, the order of the event sequence should also be tested to detect failure in any possible sequences of the event. In many real time or reactive system, some faults do occur as a result interactions of some particular order of the inputs or events. In some other systems, sequence of inputs produce significant results to how such system process the inputs and produce the output. For these types of systems, fault might be triggered from a particular order of the input sequence, entered or given to the system. . In this paper we discuss and proposed a new strategy for generating test data for event-driven system using a bio inspired artificial intelligent, namely Bees Algorithm (BA). We discussed the implementation of BA and benchmark it with the existing approaches. 2013-07 Conference or Workshop Item PeerReviewed application/pdf en http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf Mohammed Zabil, Mohd H. and Kamal Z., Zamli (2013) Test Data Generation for Event Driven System Using Bees Algorithm. In: Postgraduate Research Workshop @ SOFTEC 2013 , Kuala Lumpur. pp. 1-6.. (Published)
spellingShingle QA75 Electronic computers. Computer science
Mohammed Zabil, Mohd H.
Kamal Z., Zamli
Test Data Generation for Event Driven System Using Bees Algorithm
title Test Data Generation for Event Driven System Using Bees Algorithm
title_full Test Data Generation for Event Driven System Using Bees Algorithm
title_fullStr Test Data Generation for Event Driven System Using Bees Algorithm
title_full_unstemmed Test Data Generation for Event Driven System Using Bees Algorithm
title_short Test Data Generation for Event Driven System Using Bees Algorithm
title_sort test data generation for event driven system using bees algorithm
topic QA75 Electronic computers. Computer science
url http://umpir.ump.edu.my/id/eprint/6942/1/Paper_1.pdf
work_keys_str_mv AT mohammedzabilmohdh testdatagenerationforeventdrivensystemusingbeesalgorithm
AT kamalzzamli testdatagenerationforeventdrivensystemusingbeesalgorithm