Ellipsometry of thin films of biological objects under conditions of total internal reflection
An analysis of the ellipsometric parameters of the reflected light from the prism – test material – air system is carried out when circularly polarized light is incident on it under the conditions of the onset of the phenomenon of total internal reflection. At the onset of total internal reflection,...
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| Format: | Article |
| Language: | English |
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Povolzhskiy State University of Telecommunications & Informatics
2022-01-01
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| Series: | Физика волновых процессов и радиотехнические системы |
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| Online Access: | https://journals.ssau.ru/pwp/article/viewFile/9999/8837 |
| _version_ | 1797382550501457920 |
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| author | Valeriy V. Yatsishen |
| author_facet | Valeriy V. Yatsishen |
| author_sort | Valeriy V. Yatsishen |
| collection | DOAJ |
| description | An analysis of the ellipsometric parameters of the reflected light from the prism – test material – air system is carried out when circularly polarized light is incident on it under the conditions of the onset of the phenomenon of total internal reflection. At the onset of total internal reflection, the ellipsometry parameter Δ shows high variability with the angle of incidence, in contrast to the parameter r0. It is shown that TIR occurs when the angle of incidence is not equal to the critical angle of the adjacent media – for two different materials, these angles differ from each other. In the case of a film, the TIR phenomenon occurs at an angle equal to the critical angle at the prism-air interface and does not depend on the film material. The results obtained show the high efficiency of using the ellipsometric method together with circularly polarized incident radiation for diagnostics of thin films made of biological material. |
| first_indexed | 2024-03-08T21:07:03Z |
| format | Article |
| id | doaj.art-00a78a13e9634bf1938bae05f73b7b5a |
| institution | Directory Open Access Journal |
| issn | 1810-3189 2782-294X |
| language | English |
| last_indexed | 2024-03-08T21:07:03Z |
| publishDate | 2022-01-01 |
| publisher | Povolzhskiy State University of Telecommunications & Informatics |
| record_format | Article |
| series | Физика волновых процессов и радиотехнические системы |
| spelling | doaj.art-00a78a13e9634bf1938bae05f73b7b5a2023-12-22T10:31:41ZengPovolzhskiy State University of Telecommunications & InformaticsФизика волновых процессов и радиотехнические системы1810-31892782-294X2022-01-0124471210.18469/1810-3189.2021.24.4.7-128568Ellipsometry of thin films of biological objects under conditions of total internal reflectionValeriy V. Yatsishen0https://orcid.org/0000-0003-4185-2333Volgograd State UniversityAn analysis of the ellipsometric parameters of the reflected light from the prism – test material – air system is carried out when circularly polarized light is incident on it under the conditions of the onset of the phenomenon of total internal reflection. At the onset of total internal reflection, the ellipsometry parameter Δ shows high variability with the angle of incidence, in contrast to the parameter r0. It is shown that TIR occurs when the angle of incidence is not equal to the critical angle of the adjacent media – for two different materials, these angles differ from each other. In the case of a film, the TIR phenomenon occurs at an angle equal to the critical angle at the prism-air interface and does not depend on the film material. The results obtained show the high efficiency of using the ellipsometric method together with circularly polarized incident radiation for diagnostics of thin films made of biological material.https://journals.ssau.ru/pwp/article/viewFile/9999/8837elliptically polarized lightellipsometry parametersangular reflection spectratotal internal reflectioncritical angle |
| spellingShingle | Valeriy V. Yatsishen Ellipsometry of thin films of biological objects under conditions of total internal reflection Физика волновых процессов и радиотехнические системы elliptically polarized light ellipsometry parameters angular reflection spectra total internal reflection critical angle |
| title | Ellipsometry of thin films of biological objects under conditions of total internal reflection |
| title_full | Ellipsometry of thin films of biological objects under conditions of total internal reflection |
| title_fullStr | Ellipsometry of thin films of biological objects under conditions of total internal reflection |
| title_full_unstemmed | Ellipsometry of thin films of biological objects under conditions of total internal reflection |
| title_short | Ellipsometry of thin films of biological objects under conditions of total internal reflection |
| title_sort | ellipsometry of thin films of biological objects under conditions of total internal reflection |
| topic | elliptically polarized light ellipsometry parameters angular reflection spectra total internal reflection critical angle |
| url | https://journals.ssau.ru/pwp/article/viewFile/9999/8837 |
| work_keys_str_mv | AT valeriyvyatsishen ellipsometryofthinfilmsofbiologicalobjectsunderconditionsoftotalinternalreflection |