Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector
The precision and accuracy of diffraction measurements with 2D area detectors depends on how well the experimental geometry is known. A method is described to measure the module geometry in order to obtain accurate strain data using a new Eiger2 4M CdTe detector. Smooth Debye–Scherrer powder diffrac...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-02-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/12/2/255 |
| _version_ | 1797481390302822400 |
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| author | Jonathan P. Wright Carlotta Giacobbe Eleanor Lawrence Bright |
| author_facet | Jonathan P. Wright Carlotta Giacobbe Eleanor Lawrence Bright |
| author_sort | Jonathan P. Wright |
| collection | DOAJ |
| description | The precision and accuracy of diffraction measurements with 2D area detectors depends on how well the experimental geometry is known. A method is described to measure the module geometry in order to obtain accurate strain data using a new Eiger2 4M CdTe detector. Smooth Debye–Scherrer powder diffraction rings with excellent signal to noise were collected by using a fine-grained sample of CeO<sub>2</sub>. From these powder patterns, the different components of the module alignment errors could be observed when the overall detector position was moved. A least squares fitting method was used to refine the detector module and scattering geometry for a series of powder patterns with different beam centers. A precision that is around 1/350 pixel for the module positions was obtained from the fit. This calibration was checked by free refinement of the unit cell of a silicon crystal that gave a maximum residual strain value of 2.1 × 10<sup>−5</sup> as the deviation from cubic symmetry. |
| first_indexed | 2024-03-09T22:13:53Z |
| format | Article |
| id | doaj.art-01009d8e8d684079ba8d8fed12d06ecf |
| institution | Directory Open Access Journal |
| issn | 2073-4352 |
| language | English |
| last_indexed | 2024-03-09T22:13:53Z |
| publishDate | 2022-02-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Crystals |
| spelling | doaj.art-01009d8e8d684079ba8d8fed12d06ecf2023-11-23T19:25:30ZengMDPI AGCrystals2073-43522022-02-0112225510.3390/cryst12020255Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel DetectorJonathan P. Wright0Carlotta Giacobbe1Eleanor Lawrence Bright2ESRF-The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble, FranceESRF-The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble, FranceESRF-The European Synchrotron, 71 Avenue des Martyrs, 38000 Grenoble, FranceThe precision and accuracy of diffraction measurements with 2D area detectors depends on how well the experimental geometry is known. A method is described to measure the module geometry in order to obtain accurate strain data using a new Eiger2 4M CdTe detector. Smooth Debye–Scherrer powder diffraction rings with excellent signal to noise were collected by using a fine-grained sample of CeO<sub>2</sub>. From these powder patterns, the different components of the module alignment errors could be observed when the overall detector position was moved. A least squares fitting method was used to refine the detector module and scattering geometry for a series of powder patterns with different beam centers. A precision that is around 1/350 pixel for the module positions was obtained from the fit. This calibration was checked by free refinement of the unit cell of a silicon crystal that gave a maximum residual strain value of 2.1 × 10<sup>−5</sup> as the deviation from cubic symmetry.https://www.mdpi.com/2073-4352/12/2/255distortioncorrectionpixel detectorX-ray diffractionstrain |
| spellingShingle | Jonathan P. Wright Carlotta Giacobbe Eleanor Lawrence Bright Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector Crystals distortion correction pixel detector X-ray diffraction strain |
| title | Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector |
| title_full | Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector |
| title_fullStr | Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector |
| title_full_unstemmed | Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector |
| title_short | Using Powder Diffraction Patterns to Calibrate the Module Geometry of a Pixel Detector |
| title_sort | using powder diffraction patterns to calibrate the module geometry of a pixel detector |
| topic | distortion correction pixel detector X-ray diffraction strain |
| url | https://www.mdpi.com/2073-4352/12/2/255 |
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