Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy
Gold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometri...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2014-10-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4897340 |
| _version_ | 1811266863360901120 |
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| author | Pia C. Lansåker Anders Hallén Gunnar A. Niklasson Claes G. Granqvist |
| author_facet | Pia C. Lansåker Anders Hallén Gunnar A. Niklasson Claes G. Granqvist |
| author_sort | Pia C. Lansåker |
| collection | DOAJ |
| description | Gold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometric thickness dg—from the substrate to the tops of the nanoparticles—was obtained by scanning electron microscopy (SEM) combined with image analysis as well as by atomic force microscopy (AFM). The various techniques yielded an internally consistent characterization of the films. In particular, very similar results for dg were obtained by SEM with image analysis and by AFM. |
| first_indexed | 2024-04-12T20:51:00Z |
| format | Article |
| id | doaj.art-01301596795c45c892018816930fbbd9 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-04-12T20:51:00Z |
| publishDate | 2014-10-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-01301596795c45c892018816930fbbd92022-12-22T03:17:07ZengAIP Publishing LLCAIP Advances2158-32262014-10-01410107101107101-610.1063/1.4897340005410ADVCharacterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopyPia C. Lansåker0Anders Hallén1Gunnar A. Niklasson2Claes G. Granqvist3Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, P. O. Box 534, SE-751 21 Uppsala, SwedenRoyal Institute of Technology, KTH-ICT, Elektrum 229, Kista, SE-164 40 Stockholm, SwedenDepartment of Engineering Sciences, The Ångström Laboratory, Uppsala University, P. O. Box 534, SE-751 21 Uppsala, SwedenDepartment of Engineering Sciences, The Ångström Laboratory, Uppsala University, P. O. Box 534, SE-751 21 Uppsala, SwedenGold nanoparticle films are of interest in several branches of science and technology, and accurate sample characterization is needed but technically demanding. We prepared such films by DC magnetron sputtering and recorded their mass thickness by Rutherford backscattering spectroscopy. The geometric thickness dg—from the substrate to the tops of the nanoparticles—was obtained by scanning electron microscopy (SEM) combined with image analysis as well as by atomic force microscopy (AFM). The various techniques yielded an internally consistent characterization of the films. In particular, very similar results for dg were obtained by SEM with image analysis and by AFM.http://dx.doi.org/10.1063/1.4897340 |
| spellingShingle | Pia C. Lansåker Anders Hallén Gunnar A. Niklasson Claes G. Granqvist Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy AIP Advances |
| title | Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy |
| title_full | Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy |
| title_fullStr | Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy |
| title_full_unstemmed | Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy |
| title_short | Characterization of gold nanoparticle films: Rutherford backscattering spectroscopy, scanning electron microscopy with image analysis, and atomic force microscopy |
| title_sort | characterization of gold nanoparticle films rutherford backscattering spectroscopy scanning electron microscopy with image analysis and atomic force microscopy |
| url | http://dx.doi.org/10.1063/1.4897340 |
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