A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction

In this work, as Study on the structural and electrical properties ofPbo.9Sn0.1Se/Si hetrojunction was made by depositing compound of Lead, Tinand Selenide film on Si by thermal evaporation.XRD diffraction analysis of the film, shows the dominant crystalorientation is (200) as well as (Pbo.9Sn0.1Se)...

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Main Author: Alwan M. Alwan
Format: Article
Language:English
Published: Unviversity of Technology- Iraq 2007-12-01
Series:Engineering and Technology Journal
Online Access:https://etj.uotechnology.edu.iq/article_25979_a8503019c97a40e46e65d009993437c2.pdf
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author Alwan M. Alwan
author_facet Alwan M. Alwan
author_sort Alwan M. Alwan
collection DOAJ
description In this work, as Study on the structural and electrical properties ofPbo.9Sn0.1Se/Si hetrojunction was made by depositing compound of Lead, Tinand Selenide film on Si by thermal evaporation.XRD diffraction analysis of the film, shows the dominant crystalorientation is (200) as well as (Pbo.9Sn0.1Se) film deposited is polycrystallinestructure.Electrical properties of Pbo.9Sn0.1Se/Si heterojunction detector have beeninvestigated. The electrical properties under dark condition show a rectifyingbehavior with low rectification factor, and exhibit soft breakdown reversecurrent. C-V characteristics suggest that the fabricated diode was abrupttype, built in potential determined by extrapolation from 1/C2-V curve to thepoint (V=0) and it was equal to (0.4V).
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spelling doaj.art-01848fdf9cea499b8195d9a4960b89462024-02-04T17:54:18ZengUnviversity of Technology- IraqEngineering and Technology Journal1681-69002412-07582007-12-0125101149115310.30684/etj.25.10.525979A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si HeterojunctionAlwan M. AlwanIn this work, as Study on the structural and electrical properties ofPbo.9Sn0.1Se/Si hetrojunction was made by depositing compound of Lead, Tinand Selenide film on Si by thermal evaporation.XRD diffraction analysis of the film, shows the dominant crystalorientation is (200) as well as (Pbo.9Sn0.1Se) film deposited is polycrystallinestructure.Electrical properties of Pbo.9Sn0.1Se/Si heterojunction detector have beeninvestigated. The electrical properties under dark condition show a rectifyingbehavior with low rectification factor, and exhibit soft breakdown reversecurrent. C-V characteristics suggest that the fabricated diode was abrupttype, built in potential determined by extrapolation from 1/C2-V curve to thepoint (V=0) and it was equal to (0.4V).https://etj.uotechnology.edu.iq/article_25979_a8503019c97a40e46e65d009993437c2.pdf
spellingShingle Alwan M. Alwan
A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
Engineering and Technology Journal
title A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
title_full A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
title_fullStr A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
title_full_unstemmed A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
title_short A Study On the Structure and Electrical Properties of Pbo.9Sn0.1Se/Si Heterojunction
title_sort study on the structure and electrical properties of pbo 9sn0 1se si heterojunction
url https://etj.uotechnology.edu.iq/article_25979_a8503019c97a40e46e65d009993437c2.pdf
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