APA (7th ed.) Citation

Yang, K., Han, C., Feng, J., Tang, Y., Xie, Z., & Hu, S. (2021). Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. MDPI AG.

Chicago Style (17th ed.) Citation

Yang, Kejun, Chenhaolei Han, Jinhua Feng, Yan Tang, Zhongye Xie, and Song Hu. Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. MDPI AG, 2021.

MLA (9th ed.) Citation

Yang, Kejun, et al. Film Thickness-Profile Measurement Using Iterative Peak Separation Structured Illumination Microscopy. MDPI AG, 2021.