A Stochastic Geometry Approach to EMF Exposure Modeling

Downlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson Point Process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived fro...

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Main Authors: Quentin Gontier, Lucas Petrillo, Francois Rottenberg, Francois Horlin, Joe Wiart, Claude Oestges, Philippe De Doncker
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9462948/
_version_ 1811274192753000448
author Quentin Gontier
Lucas Petrillo
Francois Rottenberg
Francois Horlin
Joe Wiart
Claude Oestges
Philippe De Doncker
author_facet Quentin Gontier
Lucas Petrillo
Francois Rottenberg
Francois Horlin
Joe Wiart
Claude Oestges
Philippe De Doncker
author_sort Quentin Gontier
collection DOAJ
description Downlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson Point Process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived from a simple propagation model taking into account the height of the base stations. The error on exposure made by taking a limited number of base stations, instead of the whole set, is quantified. The relative impact of the model parameters on the statistics of exposure is highlighted. The method is then applied and the model parameters are calibrated using experimental data obtained by drive-tests in two Brussels municipalities, in Belgium, for the 2100 MHz and 2600 MHz frequency bands. It is shown that the proposed model fits experimental values, paving the way to a new methodology to assess general public exposure to electromagnetic fields, for any frequency band. An insight is given on how to apply the methodology to a real case without access to experimental data.
first_indexed 2024-04-12T23:14:32Z
format Article
id doaj.art-02930bd368d740bd937a72d6d4ba5a07
institution Directory Open Access Journal
issn 2169-3536
language English
last_indexed 2024-04-12T23:14:32Z
publishDate 2021-01-01
publisher IEEE
record_format Article
series IEEE Access
spelling doaj.art-02930bd368d740bd937a72d6d4ba5a072022-12-22T03:12:43ZengIEEEIEEE Access2169-35362021-01-019917779178710.1109/ACCESS.2021.30918049462948A Stochastic Geometry Approach to EMF Exposure ModelingQuentin Gontier0https://orcid.org/0000-0003-2490-5608Lucas Petrillo1Francois Rottenberg2https://orcid.org/0000-0002-2150-8511Francois Horlin3https://orcid.org/0000-0001-5790-7031Joe Wiart4Claude Oestges5https://orcid.org/0000-0002-0902-4565Philippe De Doncker6https://orcid.org/0000-0003-0187-575XWireless Communications Group, Université libre de Bruxelles, Brussels, BelgiumBrussels Environment, Brussels, BelgiumESAT-DRAMCO, Ghent Technology Campus, KU Leuven, Ghent, BelgiumWireless Communications Group, Université libre de Bruxelles, Brussels, BelgiumChaire C2M, LTCI, Telecom Paris, Institut Polytechnique de Paris, Palaiseau, FranceICTEAM Institute, Université catholique de Louvain, Louvain-la-Neuve, BelgiumWireless Communications Group, Université libre de Bruxelles, Brussels, BelgiumDownlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson Point Process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived from a simple propagation model taking into account the height of the base stations. The error on exposure made by taking a limited number of base stations, instead of the whole set, is quantified. The relative impact of the model parameters on the statistics of exposure is highlighted. The method is then applied and the model parameters are calibrated using experimental data obtained by drive-tests in two Brussels municipalities, in Belgium, for the 2100 MHz and 2600 MHz frequency bands. It is shown that the proposed model fits experimental values, paving the way to a new methodology to assess general public exposure to electromagnetic fields, for any frequency band. An insight is given on how to apply the methodology to a real case without access to experimental data.https://ieeexplore.ieee.org/document/9462948/Cellular networksexposurePoisson Point Processstochastic geometry
spellingShingle Quentin Gontier
Lucas Petrillo
Francois Rottenberg
Francois Horlin
Joe Wiart
Claude Oestges
Philippe De Doncker
A Stochastic Geometry Approach to EMF Exposure Modeling
IEEE Access
Cellular networks
exposure
Poisson Point Process
stochastic geometry
title A Stochastic Geometry Approach to EMF Exposure Modeling
title_full A Stochastic Geometry Approach to EMF Exposure Modeling
title_fullStr A Stochastic Geometry Approach to EMF Exposure Modeling
title_full_unstemmed A Stochastic Geometry Approach to EMF Exposure Modeling
title_short A Stochastic Geometry Approach to EMF Exposure Modeling
title_sort stochastic geometry approach to emf exposure modeling
topic Cellular networks
exposure
Poisson Point Process
stochastic geometry
url https://ieeexplore.ieee.org/document/9462948/
work_keys_str_mv AT quentingontier astochasticgeometryapproachtoemfexposuremodeling
AT lucaspetrillo astochasticgeometryapproachtoemfexposuremodeling
AT francoisrottenberg astochasticgeometryapproachtoemfexposuremodeling
AT francoishorlin astochasticgeometryapproachtoemfexposuremodeling
AT joewiart astochasticgeometryapproachtoemfexposuremodeling
AT claudeoestges astochasticgeometryapproachtoemfexposuremodeling
AT philippededoncker astochasticgeometryapproachtoemfexposuremodeling
AT quentingontier stochasticgeometryapproachtoemfexposuremodeling
AT lucaspetrillo stochasticgeometryapproachtoemfexposuremodeling
AT francoisrottenberg stochasticgeometryapproachtoemfexposuremodeling
AT francoishorlin stochasticgeometryapproachtoemfexposuremodeling
AT joewiart stochasticgeometryapproachtoemfexposuremodeling
AT claudeoestges stochasticgeometryapproachtoemfexposuremodeling
AT philippededoncker stochasticgeometryapproachtoemfexposuremodeling