Piezoresponse force microscopy and nanoferroic phenomena

Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical...

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Main Authors: Alexei Gruverman, Marin Alexe, Dennis Meier
Format: Article
Language:English
Published: Nature Portfolio 2019-04-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-019-09650-8
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author Alexei Gruverman
Marin Alexe
Dennis Meier
author_facet Alexei Gruverman
Marin Alexe
Dennis Meier
author_sort Alexei Gruverman
collection DOAJ
description Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.
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spelling doaj.art-02c6872dc5104de8b0ed9ee52ea360e22022-12-21T20:35:43ZengNature PortfolioNature Communications2041-17232019-04-011011910.1038/s41467-019-09650-8Piezoresponse force microscopy and nanoferroic phenomenaAlexei Gruverman0Marin Alexe1Dennis Meier2Department of Physics and Astronomy, University of NebraskaDepartment of Physics, University of WarwickDepartment of Materials Science and Engineering, Norwegian University of Science and Technology (NTNU)Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.https://doi.org/10.1038/s41467-019-09650-8
spellingShingle Alexei Gruverman
Marin Alexe
Dennis Meier
Piezoresponse force microscopy and nanoferroic phenomena
Nature Communications
title Piezoresponse force microscopy and nanoferroic phenomena
title_full Piezoresponse force microscopy and nanoferroic phenomena
title_fullStr Piezoresponse force microscopy and nanoferroic phenomena
title_full_unstemmed Piezoresponse force microscopy and nanoferroic phenomena
title_short Piezoresponse force microscopy and nanoferroic phenomena
title_sort piezoresponse force microscopy and nanoferroic phenomena
url https://doi.org/10.1038/s41467-019-09650-8
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