Piezoresponse force microscopy and nanoferroic phenomena
Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical...
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Format: | Article |
Language: | English |
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Nature Portfolio
2019-04-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-019-09650-8 |
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author | Alexei Gruverman Marin Alexe Dennis Meier |
author_facet | Alexei Gruverman Marin Alexe Dennis Meier |
author_sort | Alexei Gruverman |
collection | DOAJ |
description | Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM. |
first_indexed | 2024-12-19T04:37:40Z |
format | Article |
id | doaj.art-02c6872dc5104de8b0ed9ee52ea360e2 |
institution | Directory Open Access Journal |
issn | 2041-1723 |
language | English |
last_indexed | 2024-12-19T04:37:40Z |
publishDate | 2019-04-01 |
publisher | Nature Portfolio |
record_format | Article |
series | Nature Communications |
spelling | doaj.art-02c6872dc5104de8b0ed9ee52ea360e22022-12-21T20:35:43ZengNature PortfolioNature Communications2041-17232019-04-011011910.1038/s41467-019-09650-8Piezoresponse force microscopy and nanoferroic phenomenaAlexei Gruverman0Marin Alexe1Dennis Meier2Department of Physics and Astronomy, University of NebraskaDepartment of Physics, University of WarwickDepartment of Materials Science and Engineering, Norwegian University of Science and Technology (NTNU)Abstract Since its inception more than 25 years ago, Piezoresponse Force Microscopy (PFM) has become one of the mainstream techniques in the field of nanoferroic materials. This review describes the evolution of PFM from an imaging technique to a set of advanced methods, which have played a critical role in launching new areas of ferroic research, such as multiferroic devices and domain wall nanoelectronics. The paper reviews the impact of advanced PFM modes concerning the discovery and scientific understanding of novel nanoferroic phenomena and discusses challenges associated with the correct interpretation of PFM data. In conclusion, it offers an outlook for future trends and developments in PFM.https://doi.org/10.1038/s41467-019-09650-8 |
spellingShingle | Alexei Gruverman Marin Alexe Dennis Meier Piezoresponse force microscopy and nanoferroic phenomena Nature Communications |
title | Piezoresponse force microscopy and nanoferroic phenomena |
title_full | Piezoresponse force microscopy and nanoferroic phenomena |
title_fullStr | Piezoresponse force microscopy and nanoferroic phenomena |
title_full_unstemmed | Piezoresponse force microscopy and nanoferroic phenomena |
title_short | Piezoresponse force microscopy and nanoferroic phenomena |
title_sort | piezoresponse force microscopy and nanoferroic phenomena |
url | https://doi.org/10.1038/s41467-019-09650-8 |
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