Storage and Counter Based Logic Built-In Self-Test
Recent reports of silent data corruption because of hardware faults in large data centers bring to the forefront the importance of in-field testing. In-field testing, enabled by logic built-in self-test (<inline-formula> <tex-math notation="LaTeX">$LBIST$ </tex-math></...
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| Format: | Article |
| Language: | English |
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IEEE
2023-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/10352137/ |