Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing

Time-Varying Pseudorandom Disturbed Pattern Generation Algorithm for Track Circuit Equipment Testing

To improve the test accuracy and fault coverage of high-speed railway-related equipment boards, a time-varying pseudorandom disturbance algorithm based on the automatic test pattern generation technology in chip testing is proposed. The algorithm combines the pseudorandom pattern generation algorith...

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Bibliographic Details
Main Authors: Xiaoming Chen, Zhixuan Wang, Zhiyang Yu, Hsiang-Chen Chui
Format: Article
Language:English
Published: MDPI AG 2022-05-01
Series:Micromachines
Subjects:
high-speed railway
ATPG 2
pseudorandom pattern 3
D algorithm 4
Online Access:https://www.mdpi.com/2072-666X/13/6/853

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