Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor

The energy expediency of the existence of Er1-xScxNiSb substitutional solid solution up to the concentration x≈0.10 was established by modeling the variation of free energy ΔG(x) values (Helmholtz potential). At higher Sc concentrations, x> 0.10, there is stratification (spinoidal decomposition o...

Full description

Bibliographic Details
Main Authors: Yu. Stadnyk, V.A. Romaka, A. Horyn, V.V. Romaka, L. Romaka, P. Klyzub, V. Pashkevych, P. Gorpenyuk
Format: Article
Language:English
Published: Vasyl Stefanyk Precarpathian National University 2021-09-01
Series:Фізика і хімія твердого тіла
Subjects:
Online Access:https://journals.pnu.edu.ua/index.php/pcss/article/view/4947
_version_ 1798022550540779520
author Yu. Stadnyk
V.A. Romaka
A. Horyn
V.V. Romaka
L. Romaka
P. Klyzub
V. Pashkevych
P. Gorpenyuk
author_facet Yu. Stadnyk
V.A. Romaka
A. Horyn
V.V. Romaka
L. Romaka
P. Klyzub
V. Pashkevych
P. Gorpenyuk
author_sort Yu. Stadnyk
collection DOAJ
description The energy expediency of the existence of Er1-xScxNiSb substitutional solid solution up to the concentration x≈0.10 was established by modeling the variation of free energy ΔG(x) values (Helmholtz potential). At higher Sc concentrations, x> 0.10, there is stratification (spinoidal decomposition of phase). It is shown that in the structure of p-ErNiSb semiconductor there are vacancies in positions 4a and 4c of Er and Ni atoms, respectively, generating structural defects of acceptor nature. The number of vacancies in position 4a is twice less than in position 4c. This ratio also remains for p-Er1-xScxNiSb. Doping of p-ErNiSb semiconductor by Sc atoms by substitution of Er atoms is also accompanied by the occupation of vacancies in position 4a. In this case, Ni atoms occupy vacancies in position 4c, which can be accompanied by the process of ordering the p-Er1-xScxNiSb structure. Occupation of vacancies by Sc and Ni atoms leads to an increase of the concentration of free electrons, an enlarge of the compensation degree of semiconductor, which changes the position of the Fermi level εF and the mechanisms of electrical conductivity.
first_indexed 2024-04-11T17:31:52Z
format Article
id doaj.art-0423ef0b4ff941b8874d71ab7e1d8bf2
institution Directory Open Access Journal
issn 1729-4428
2309-8589
language English
last_indexed 2024-04-11T17:31:52Z
publishDate 2021-09-01
publisher Vasyl Stefanyk Precarpathian National University
record_format Article
series Фізика і хімія твердого тіла
spelling doaj.art-0423ef0b4ff941b8874d71ab7e1d8bf22022-12-22T04:11:58ZengVasyl Stefanyk Precarpathian National UniversityФізика і хімія твердого тіла1729-44282309-85892021-09-0122350951510.15330/pcss.22.3.509-5154947Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductorYu. Stadnyk0V.A. Romaka1A. Horyn2V.V. Romaka3L. Romaka4P. Klyzub5V. Pashkevych6P. Gorpenyuk7Ivan Franko National University of LvivLviv Polytechnic National UniversityIvan Franko National University of LvivTechnische Universität DresdenIvan Franko National University of LvivIvan Franko National University of LvivLviv Polytechnic National UniversityLviv Polytechnic National UniversityThe energy expediency of the existence of Er1-xScxNiSb substitutional solid solution up to the concentration x≈0.10 was established by modeling the variation of free energy ΔG(x) values (Helmholtz potential). At higher Sc concentrations, x> 0.10, there is stratification (spinoidal decomposition of phase). It is shown that in the structure of p-ErNiSb semiconductor there are vacancies in positions 4a and 4c of Er and Ni atoms, respectively, generating structural defects of acceptor nature. The number of vacancies in position 4a is twice less than in position 4c. This ratio also remains for p-Er1-xScxNiSb. Doping of p-ErNiSb semiconductor by Sc atoms by substitution of Er atoms is also accompanied by the occupation of vacancies in position 4a. In this case, Ni atoms occupy vacancies in position 4c, which can be accompanied by the process of ordering the p-Er1-xScxNiSb structure. Occupation of vacancies by Sc and Ni atoms leads to an increase of the concentration of free electrons, an enlarge of the compensation degree of semiconductor, which changes the position of the Fermi level εF and the mechanisms of electrical conductivity.https://journals.pnu.edu.ua/index.php/pcss/article/view/4947semiconductorelectrical conductivitythermopower coefficientfermi lervel
spellingShingle Yu. Stadnyk
V.A. Romaka
A. Horyn
V.V. Romaka
L. Romaka
P. Klyzub
V. Pashkevych
P. Gorpenyuk
Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
Фізика і хімія твердого тіла
semiconductor
electrical conductivity
thermopower coefficient
fermi lervel
title Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
title_full Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
title_fullStr Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
title_full_unstemmed Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
title_short Modeling of structural and energetic parameters of р-Er1-xScxNiSb semiconductor
title_sort modeling of structural and energetic parameters of р er1 xscxnisb semiconductor
topic semiconductor
electrical conductivity
thermopower coefficient
fermi lervel
url https://journals.pnu.edu.ua/index.php/pcss/article/view/4947
work_keys_str_mv AT yustadnyk modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT varomaka modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT ahoryn modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT vvromaka modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT lromaka modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT pklyzub modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT vpashkevych modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor
AT pgorpenyuk modelingofstructuralandenergeticparametersofrer1xscxnisbsemiconductor