Analysis of polarization characteristics of freeform surface optical system

Freeform surfaces are widely used in off-axis optical systems with large aperture, large field of view, and long focal length. The polarization effect caused by the non-rotationally symmetrical shape has an impact on the system’s polarization imaging quality and measurement accuracy. Based on Jones’...

Full description

Bibliographic Details
Main Authors: Zhang Yilan, Shi Haodong, Jiang Huilin
Format: Article
Language:English
Published: EDP Sciences 2022-01-01
Series:ITM Web of Conferences
Subjects:
Online Access:https://www.itm-conferences.org/articles/itmconf/pdf/2022/05/itmconf_cscns2022_01053.pdf
Description
Summary:Freeform surfaces are widely used in off-axis optical systems with large aperture, large field of view, and long focal length. The polarization effect caused by the non-rotationally symmetrical shape has an impact on the system’s polarization imaging quality and measurement accuracy. Based on Jones’ notation, this paper proposes a polarization aberration analysis method for fringed Zernike polynomial freeform optical systems and constructs a full-field polarisation aberration analysis model of non-rotationally symmetric freeform reflective optical systems. The light propagation vector k is added on the basis of the two-dimensional ray tracing algorithm. By tracing the full-field polarized light of the off-axis optical system in the field of view, the Jones pupil diagram is obtained. The phase aberration, diattenuation and retardance are separated by Pauli decomposition and SVD decomposition. The off-axis freeform surface optical system is designed. The analysis results show that the phase aberration of the off-axis freeform surface optical system is directly related to the surface shape of the freeform surface. The changes of the freeform surface to the diattenuation and retardance are both 56% of the diattenuation and retardance of the sistem. For deep-space telescopes and lithography systems, it is of great significance for improving system accuracy to master this change.
ISSN:2271-2097