Benchmarking of Multi-Bridge-Channel FETs Toward Analog and Mixed-Mode Circuit Applications

In this study, for the very first time developing of n- and p-type 3-D single-channel (SC) FinFET and gate-all-around (GAA) Multi-Bridge-Channel FETs (MBCFET) like nanowire FET (NWFET) and nanosheet FET (NSFET) are benchmarked towards device and circuit levels which are emulated with International R...

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Bibliographic Details
Main Authors: Vakkalakula Bharath Sreenivasulu, Aruna Kumari Neelam, Asisa Kumar Panigrahy, Lokesh Vakkalakula, Jawar Singh, Shiv Govind Singh
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10382496/