Benchmarking of Multi-Bridge-Channel FETs Toward Analog and Mixed-Mode Circuit Applications
In this study, for the very first time developing of n- and p-type 3-D single-channel (SC) FinFET and gate-all-around (GAA) Multi-Bridge-Channel FETs (MBCFET) like nanowire FET (NWFET) and nanosheet FET (NSFET) are benchmarked towards device and circuit levels which are emulated with International R...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10382496/ |