In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindente...

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Bibliographic Details
Main Authors: Gudrun Lotze, Anand H. S. Iyer, Olof Bäcke, Sebastian Kalbfleisch, Magnus Hörnqvist Colliander
Format: Article
Language:English
Published: International Union of Crystallography 2024-01-01
Series:Journal of Synchrotron Radiation
Subjects:
nanodiffraction
stress mapping
in situ deformation
nanoindentation
sample environment
Online Access:http://scripts.iucr.org/cgi-bin/paper?S1600577523010093

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