Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy

With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based o...

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Bibliographic Details
Main Authors: Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro, Tyler Enright, Peter Grütter
Format: Article
Language:English
Published: MDPI AG 2019-10-01
Series:Sensors
Subjects:
resonance frequency
amplitude dependence of resonance frequency
scanning probe microscopy
atomic force microscopy
frequency modulation atomic force microscopy
noncontact atomic force microscopy
Online Access:https://www.mdpi.com/1424-8220/19/20/4510

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