An efficient method for faults diagnosis in analog circuits based on machine learning classifiers

An efficient method for faults diagnosis in analog circuits based on machine learning classifiers

The presented paper introduces an accurate approach for detecting and classifying parametric or soft faults that affect analog integrated circuits. This technique is based on the use of machine learning algorithm to improve the accuracy and the performance of fault classification process. To achieve...

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Bibliographic Details
Main Authors: Abderrazak Arabi, Mouloud Ayad, Nacerdine Bourouba, Mourad Benziane, Issam Griche, Sherif S.M. Ghoneim, Enas Ali, Mahmoud Elsisi, Ramy N.R. Ghaly
Format: Article
Language:English
Published: Elsevier 2023-08-01
Series:Alexandria Engineering Journal
Subjects:
Analog integrated circuits
Parametric faults
Fault detection
Fault classification
Machine learning
Online Access:http://www.sciencedirect.com/science/article/pii/S1110016823005677

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