Ultrafast current imaging by Bayesian inversion
Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-size...
| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2018-02-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-017-02455-7 |
| _version_ | 1818683195995979776 |
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| author | S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan |
| author_facet | S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan |
| author_sort | S. Somnath |
| collection | DOAJ |
| description | Scanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-sized areas. |
| first_indexed | 2024-12-17T10:30:53Z |
| format | Article |
| id | doaj.art-0560a29d3d0542a29e7e7ef7cbf10762 |
| institution | Directory Open Access Journal |
| issn | 2041-1723 |
| language | English |
| last_indexed | 2024-12-17T10:30:53Z |
| publishDate | 2018-02-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Nature Communications |
| spelling | doaj.art-0560a29d3d0542a29e7e7ef7cbf107622022-12-21T21:52:32ZengNature PortfolioNature Communications2041-17232018-02-019111110.1038/s41467-017-02455-7Ultrafast current imaging by Bayesian inversionS. Somnath0K. J. H. Law1A. N. Morozovska2P. Maksymovych3Y. Kim4X. Lu5M. Alexe6R. Archibald7S. V. Kalinin8S. Jesse9R. K. Vasudevan10Center for Nanophase Materials Sciences, Oak Ridge National LaboratoryCenter for Nanophase Materials Sciences, Oak Ridge National LaboratoryInstitute of Physics, National Academy of Sciences of UkraineCenter for Nanophase Materials Sciences, Oak Ridge National LaboratorySchool of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU)The State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, Xidian UniversityDepartment of Physics, University of WarwickCenter for Nanophase Materials Sciences, Oak Ridge National LaboratoryCenter for Nanophase Materials Sciences, Oak Ridge National LaboratoryCenter for Nanophase Materials Sciences, Oak Ridge National LaboratoryCenter for Nanophase Materials Sciences, Oak Ridge National LaboratoryScanning probe microscopy is widely used to characterize material properties with atomic resolution, yet electronic property mapping is normally constrained by slow data acquisition. Somnath et al. show a current–voltage method, which enables fast electronic spectroscopy mapping over micrometer-sized areas.https://doi.org/10.1038/s41467-017-02455-7 |
| spellingShingle | S. Somnath K. J. H. Law A. N. Morozovska P. Maksymovych Y. Kim X. Lu M. Alexe R. Archibald S. V. Kalinin S. Jesse R. K. Vasudevan Ultrafast current imaging by Bayesian inversion Nature Communications |
| title | Ultrafast current imaging by Bayesian inversion |
| title_full | Ultrafast current imaging by Bayesian inversion |
| title_fullStr | Ultrafast current imaging by Bayesian inversion |
| title_full_unstemmed | Ultrafast current imaging by Bayesian inversion |
| title_short | Ultrafast current imaging by Bayesian inversion |
| title_sort | ultrafast current imaging by bayesian inversion |
| url | https://doi.org/10.1038/s41467-017-02455-7 |
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