Application of machine vision in capacitor appearance defect detection
The traditional capacitor appearance defect detection adopts manual detection, which has low efficiency, high error rate and high cost. In order to overcome the shortcomings of manual detection and improve the automation of capacitor production, a machine vision based capacitor defect detection syst...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
National Computer System Engineering Research Institute of China
2019-09-01
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| Series: | Dianzi Jishu Yingyong |
| Subjects: | |
| Online Access: | http://www.chinaaet.com/article/3000108595 |
| _version_ | 1818391789107675136 |
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| author | Yu Yang Chen Zuozheng Chen Zhuyang Shen Weijun |
| author_facet | Yu Yang Chen Zuozheng Chen Zhuyang Shen Weijun |
| author_sort | Yu Yang |
| collection | DOAJ |
| description | The traditional capacitor appearance defect detection adopts manual detection, which has low efficiency, high error rate and high cost. In order to overcome the shortcomings of manual detection and improve the automation of capacitor production, a machine vision based capacitor defect detection system is designed. Firstly, the image is collected, pre-processed, and matched to the capacitor area. Then the threshold segmentation is used to detect the defects of the overflow and epoxy surface pores. The template matching is used to detect the characters and the shell damage defects. Finally, to meet the testing requirements of different standards，the Blob analysis is used to extract the defect features and set the threshold parameters. According to the experimental results of the prototype, the detection system greatly improves the detection efficiency and accuracy. |
| first_indexed | 2024-12-14T05:19:06Z |
| format | Article |
| id | doaj.art-066136b41829417da9a03a8ccd3e974e |
| institution | Directory Open Access Journal |
| issn | 0258-7998 |
| language | zho |
| last_indexed | 2024-12-14T05:19:06Z |
| publishDate | 2019-09-01 |
| publisher | National Computer System Engineering Research Institute of China |
| record_format | Article |
| series | Dianzi Jishu Yingyong |
| spelling | doaj.art-066136b41829417da9a03a8ccd3e974e2022-12-21T23:15:43ZzhoNational Computer System Engineering Research Institute of ChinaDianzi Jishu Yingyong0258-79982019-09-014599710010.16157/j.issn.0258-7998.1901343000108595Application of machine vision in capacitor appearance defect detectionYu Yang0Chen Zuozheng1Chen Zhuyang2Shen Weijun3Jiangsu University of Technology，Changzhou 213001，ChinaJiangsu University of Technology，Changzhou 213001，ChinaJiangsu University of Technology，Changzhou 213001，ChinaJiangsu University of Technology，Changzhou 213001，ChinaThe traditional capacitor appearance defect detection adopts manual detection, which has low efficiency, high error rate and high cost. In order to overcome the shortcomings of manual detection and improve the automation of capacitor production, a machine vision based capacitor defect detection system is designed. Firstly, the image is collected, pre-processed, and matched to the capacitor area. Then the threshold segmentation is used to detect the defects of the overflow and epoxy surface pores. The template matching is used to detect the characters and the shell damage defects. Finally, to meet the testing requirements of different standards，the Blob analysis is used to extract the defect features and set the threshold parameters. According to the experimental results of the prototype, the detection system greatly improves the detection efficiency and accuracy.http://www.chinaaet.com/article/3000108595machine visioncapacitance appearancedefect detectionthreshold segmentation;template matching |
| spellingShingle | Yu Yang Chen Zuozheng Chen Zhuyang Shen Weijun Application of machine vision in capacitor appearance defect detection Dianzi Jishu Yingyong machine vision capacitance appearance defect detection threshold segmentation;template matching |
| title | Application of machine vision in capacitor appearance defect detection |
| title_full | Application of machine vision in capacitor appearance defect detection |
| title_fullStr | Application of machine vision in capacitor appearance defect detection |
| title_full_unstemmed | Application of machine vision in capacitor appearance defect detection |
| title_short | Application of machine vision in capacitor appearance defect detection |
| title_sort | application of machine vision in capacitor appearance defect detection |
| topic | machine vision capacitance appearance defect detection threshold segmentation;template matching |
| url | http://www.chinaaet.com/article/3000108595 |
| work_keys_str_mv | AT yuyang applicationofmachinevisionincapacitorappearancedefectdetection AT chenzuozheng applicationofmachinevisionincapacitorappearancedefectdetection AT chenzhuyang applicationofmachinevisionincapacitorappearancedefectdetection AT shenweijun applicationofmachinevisionincapacitorappearancedefectdetection |