Application of machine vision in capacitor appearance defect detection
The traditional capacitor appearance defect detection adopts manual detection, which has low efficiency, high error rate and high cost. In order to overcome the shortcomings of manual detection and improve the automation of capacitor production, a machine vision based capacitor defect detection syst...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
National Computer System Engineering Research Institute of China
2019-09-01
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| Series: | Dianzi Jishu Yingyong |
| Subjects: | |
| Online Access: | http://www.chinaaet.com/article/3000108595 |