Simulating 50 keV X-ray Photon Detection in Silicon with a Down-Conversion Layer
Simulation results are presented that explore an innovative, new design for X-ray detection in the 20–50 keV range that is an alternative to traditional direct and indirect detection methods. Typical indirect detection using a scintillator must trade-off between absorption efficiency and spatial res...
Main Authors: | Kaitlin M. Anagnost, Eldred Lee, Zhehui Wang, Jifeng Liu, Eric R. Fossum |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-11-01
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Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/21/22/7566 |
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