Classification of methods for measuring current-voltage characteristics of semiconductor devices
It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current...
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| Format: | Article |
| Language: | English |
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Politehperiodika
2014-06-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| Subjects: | |
| Online Access: | http://www.tkea.com.ua/tkea/2014/2-3_2014/pdf/01.pdf |
| _version_ | 1811312934271320064 |
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| author | Iermolenko Ia. O. |
| author_facet | Iermolenko Ia. O. |
| author_sort | Iermolenko Ia. O. |
| collection | DOAJ |
| description | It is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyze existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria.
To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analyzed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified. |
| first_indexed | 2024-04-13T10:45:21Z |
| format | Article |
| id | doaj.art-078a12328d8b45af9c48fc649cdfdc53 |
| institution | Directory Open Access Journal |
| issn | 2225-5818 |
| language | English |
| last_indexed | 2024-04-13T10:45:21Z |
| publishDate | 2014-06-01 |
| publisher | Politehperiodika |
| record_format | Article |
| series | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| spelling | doaj.art-078a12328d8b45af9c48fc649cdfdc532022-12-22T02:49:48ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182014-06-012-331110.15222/TKEA2014.2-3.03Classification of methods for measuring current-voltage characteristics of semiconductor devicesIermolenko Ia. O. 0Ukraine, Alchevsk, Donbas State Technical UniversityIt is shown that computer systems for measuring current-voltage characteristics are very important for semiconductor devices production. The main criteria of efficiency of such systems are defined. It is shown that efficiency of such systems significantly depends on the methods for measuring current-voltage characteristics of semiconductor devices. The aim of this work is to analyze existing methods for measuring current-voltage characteristics of semiconductor devices and to create the classification of these methods in order to specify the most effective solutions in terms of defined criteria. To achieve this aim, the most common classifications of methods for measuring current-voltage characteristics of semiconductor devices and their main disadvantages are considered. Automated and manual, continuous, pulse, mixed, isothermal and isodynamic methods for measuring current-voltage characteristics are analyzed. As a result of the analysis and generalization of existing methods the next classification criteria are defined: the level of automation, the form of measurement signals, the condition of semiconductor device during the measurements, and the use of mathematical processing of the measurement results. With the use of these criteria the classification scheme of methods for measuring current-voltage characteristics of semiconductor devices is composed and the most effective methods are specified.http://www.tkea.com.ua/tkea/2014/2-3_2014/pdf/01.pdfcurrent-voltage characteristicsemiconductor devicemethod of measurementclassification |
| spellingShingle | Iermolenko Ia. O. Classification of methods for measuring current-voltage characteristics of semiconductor devices Tekhnologiya i Konstruirovanie v Elektronnoi Apparature current-voltage characteristic semiconductor device method of measurement classification |
| title | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_fullStr | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_full_unstemmed | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_short | Classification of methods for measuring current-voltage characteristics of semiconductor devices |
| title_sort | classification of methods for measuring current voltage characteristics of semiconductor devices |
| topic | current-voltage characteristic semiconductor device method of measurement classification |
| url | http://www.tkea.com.ua/tkea/2014/2-3_2014/pdf/01.pdf |
| work_keys_str_mv | AT iermolenkoiao classificationofmethodsformeasuringcurrentvoltagecharacteristicsofsemiconductordevices |