Real-Time Monitoring of Strain Accumulation and Relief during Epitaxy of Ultrathin Co Ferrite Films with Varied Co Content

Real-Time Monitoring of Strain Accumulation and Relief during Epitaxy of Ultrathin Co Ferrite Films with Varied Co Content

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Bibliographic Details
Main Authors: Jannis Thien, Jari Rodewald, Tobias Pohlmann, Kevin Ruwisch, Florian Bertram, Karsten Küpper, Joachim Wollschläger
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Materials
Subjects:
cobalt ferrite
ultrathin films
strain
X-ray diffraction
Online Access:https://www.mdpi.com/1996-1944/16/23/7287

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https://www.mdpi.com/1996-1944/16/23/7287

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