Memory T Cells (CD45RO) Role and Evaluation in Pathogenesis of Lichen Planus and Lichenoid Mucositis
Introduction: Memory T cells have the ability to survive in a quiescent state for longer periods and are responsible for the rapid responses on subsequent exposure to antigen. Analyzing memory T cells in Oral Lichen planus (OLP) and Lichenoid Mucositis (LM) suggest that these cells may play a ro...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
JCDR Research and Publications Private Limited
2017-05-01
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Series: | Journal of Clinical and Diagnostic Research |
Subjects: | |
Online Access: | https://jcdr.net/articles/PDF/9930/26866_CE[Ra1]_F(GH)_PF1(PrG_SS)_PFA(PrG_SS).pdf |
Summary: | Introduction: Memory T cells have the ability to survive in a
quiescent state for longer periods and are responsible for the
rapid responses on subsequent exposure to antigen. Analyzing
memory T cells in Oral Lichen planus (OLP) and Lichenoid
Mucositis (LM) suggest that these cells may play a role in the
immunopathogenic mechanisms.
Aim: To identify and evaluate Memory T cells in Lichen Planus
(LP), Lichenoid Mucositis (LM) and Normal Mucosa (NM) using
CD45RO monoclonal antibody immunohistochemically.
Materials and Methods: A total of 30 cases (15 cases of
OLP and 15 cases of LM) clinically and histopathologically
diagnosed, and 10 cases of NM were stained for CD45RO
monoclonal antibody, immunohistochemically using Biotin
Streptavidin method. Staining intensity of CD45RO expression
was statistically analysed using Chi-square Test.
Results: The present study demonstrated a higher expression
of CD45RO in connective tissue layer of OLP (53.3% intense
staining) when compared to LM (20% intense staining) and
no intense staining in NM. The difference in staining intensity
pattern between the study groups was statistically significant
(p=0.014).
Conclusion: This study demonstrates a statistically significant
rise in memory T cells in LP than in LM, indicating the possible
different immunopathogenic mechanisms. |
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ISSN: | 2249-782X 0973-709X |