A Survey of Analog-to-Digital Converters for Operation under Radiation Environments
In this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV·cm<sup>2</sup>/mg and are able to bear doses of ionizing radiati...
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| Format: | Article |
| Language: | English |
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MDPI AG
2020-10-01
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| Series: | Electronics |
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| Online Access: | https://www.mdpi.com/2079-9292/9/10/1694 |
| _version_ | 1797550838004056064 |
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| author | Ernesto Pun-García Marisa López-Vallejo |
| author_facet | Ernesto Pun-García Marisa López-Vallejo |
| author_sort | Ernesto Pun-García |
| collection | DOAJ |
| description | In this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV·cm<sup>2</sup>/mg and are able to bear doses of ionizing radiation above 50 krad(Si). An exhaustive search of ADCs with radiation characterization data has been carried out throughout the literature. The obtained collection is analyzed and compared against the state of the art of scientific ADCs, which reached years ago the electrical performance that radenv-ADCs provide nowadays. In fact, for a given Nyquist sampling rate, radenv-ADCs require significantly more power to achieve lower effective resolution. The extracted performance patterns and conclusions from our study aim to serve as reference for new developments towards more efficient implementations. As tools for this purpose, we have conceived FOM<inline-formula><math display="inline"><semantics><msub><mrow></mrow><mrow><mi>T</mi><mi>I</mi><mi>D</mi></mrow></msub></semantics></math></inline-formula> and FOM<inline-formula><math display="inline"><semantics><msub><mrow></mrow><mrow><mi>S</mi><mi>E</mi><mi>T</mi></mrow></msub></semantics></math></inline-formula>, two new figures of merit to compare radenv-ADCs that consider electrical and radiation performance. |
| first_indexed | 2024-03-10T15:35:08Z |
| format | Article |
| id | doaj.art-08927c75765541a0bfca3d26b9936f77 |
| institution | Directory Open Access Journal |
| issn | 2079-9292 |
| language | English |
| last_indexed | 2024-03-10T15:35:08Z |
| publishDate | 2020-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Electronics |
| spelling | doaj.art-08927c75765541a0bfca3d26b9936f772023-11-20T17:15:08ZengMDPI AGElectronics2079-92922020-10-01910169410.3390/electronics9101694A Survey of Analog-to-Digital Converters for Operation under Radiation EnvironmentsErnesto Pun-García0Marisa López-Vallejo1R&D Department, Arquimea Ingeniería SLU, 28918 Leganés, SpainIPTC, ETSI Telecomunicación, Universidad Politécnica de Madrid, 28040 Madrid, SpainIn this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV·cm<sup>2</sup>/mg and are able to bear doses of ionizing radiation above 50 krad(Si). An exhaustive search of ADCs with radiation characterization data has been carried out throughout the literature. The obtained collection is analyzed and compared against the state of the art of scientific ADCs, which reached years ago the electrical performance that radenv-ADCs provide nowadays. In fact, for a given Nyquist sampling rate, radenv-ADCs require significantly more power to achieve lower effective resolution. The extracted performance patterns and conclusions from our study aim to serve as reference for new developments towards more efficient implementations. As tools for this purpose, we have conceived FOM<inline-formula><math display="inline"><semantics><msub><mrow></mrow><mrow><mi>T</mi><mi>I</mi><mi>D</mi></mrow></msub></semantics></math></inline-formula> and FOM<inline-formula><math display="inline"><semantics><msub><mrow></mrow><mrow><mi>S</mi><mi>E</mi><mi>T</mi></mrow></msub></semantics></math></inline-formula>, two new figures of merit to compare radenv-ADCs that consider electrical and radiation performance.https://www.mdpi.com/2079-9292/9/10/1694ADC performance patternsADC state of the artADC surveyanalog-to-digital convertersapplications under radiation environmentsfigure of merit under radiation |
| spellingShingle | Ernesto Pun-García Marisa López-Vallejo A Survey of Analog-to-Digital Converters for Operation under Radiation Environments Electronics ADC performance patterns ADC state of the art ADC survey analog-to-digital converters applications under radiation environments figure of merit under radiation |
| title | A Survey of Analog-to-Digital Converters for Operation under Radiation Environments |
| title_full | A Survey of Analog-to-Digital Converters for Operation under Radiation Environments |
| title_fullStr | A Survey of Analog-to-Digital Converters for Operation under Radiation Environments |
| title_full_unstemmed | A Survey of Analog-to-Digital Converters for Operation under Radiation Environments |
| title_short | A Survey of Analog-to-Digital Converters for Operation under Radiation Environments |
| title_sort | survey of analog to digital converters for operation under radiation environments |
| topic | ADC performance patterns ADC state of the art ADC survey analog-to-digital converters applications under radiation environments figure of merit under radiation |
| url | https://www.mdpi.com/2079-9292/9/10/1694 |
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