Local Stress States and Microstructural Damage Response Associated with Deformation Twins in Hexagonal Close Packed Metals
The current work implements a correlative microscopy method utilizing electron back scatter diffraction, focused ion beam and digital image correlation to accurately determine spatially resolved stress profiles in the vicinity of grain/twin boundaries and tensile deformation twin tips in commerciall...
Main Authors: | Indranil Basu, Herman Fidder, Václav Ocelík, Jeff Th.M de Hosson |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-12-01
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Series: | Crystals |
Subjects: | |
Online Access: | https://www.mdpi.com/2073-4352/8/1/1 |
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