Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors

Printing technology will improve the complexity and material waste of traditional deposition and lithography processes in device fabrication. In particular, the printing process can effectively control the functional layer stacking and channel shape in thin-film transistor (TFT) devices. We prepared...

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Main Authors: Xingzhen Yan, Bo Li, Yiqiang Zhang, Yanjie Wang, Chao Wang, Yaodan Chi, Xiaotian Yang
Format: Article
Language:English
Published: MDPI AG 2023-11-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/14/11/2121
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author Xingzhen Yan
Bo Li
Yiqiang Zhang
Yanjie Wang
Chao Wang
Yaodan Chi
Xiaotian Yang
author_facet Xingzhen Yan
Bo Li
Yiqiang Zhang
Yanjie Wang
Chao Wang
Yaodan Chi
Xiaotian Yang
author_sort Xingzhen Yan
collection DOAJ
description Printing technology will improve the complexity and material waste of traditional deposition and lithography processes in device fabrication. In particular, the printing process can effectively control the functional layer stacking and channel shape in thin-film transistor (TFT) devices. We prepared the patterning indium gallium zinc oxide (IGZO) semiconductor layer with Ga, In, and Zn molar ratios of 1:2:7 on Si/SiO<sub>2</sub> substrates. And the patterning source and drain electrodes were printed on the surface of semiconductor layers to construct a TFT device with the top contact and bottom gate structures. To overcome the problem of uniform distribution of applied voltages between electrode centers and edges, we investigated whether the circular arc channel could improve the carrier regulation ability under the field effect in printed TFTs compared with a traditional structure of rectangular symmetry and a rectangular groove channel. The drain current value of the IGZO TFT with a circular arc channel pattern was significantly enhanced compared to that of a TFT with rectangular symmetric source/drain electrodes under the corresponding drain–source voltage and gate voltage. The field effect properties of the device were obviously improved by introducing the arc-shaped channel structure.
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spelling doaj.art-09090a36dac04f13bf7d0a5946cca1102023-11-24T14:56:37ZengMDPI AGMicromachines2072-666X2023-11-011411212110.3390/mi14112121Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film TransistorsXingzhen Yan0Bo Li1Yiqiang Zhang2Yanjie Wang3Chao Wang4Yaodan Chi5Xiaotian Yang6Key Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaKey Laboratory of Architectural Cold Climate Energy Management, Ministry of Education, Jilin Jianzhu University, 5088 Xincheng Street, Changchun 130118, ChinaPrinting technology will improve the complexity and material waste of traditional deposition and lithography processes in device fabrication. In particular, the printing process can effectively control the functional layer stacking and channel shape in thin-film transistor (TFT) devices. We prepared the patterning indium gallium zinc oxide (IGZO) semiconductor layer with Ga, In, and Zn molar ratios of 1:2:7 on Si/SiO<sub>2</sub> substrates. And the patterning source and drain electrodes were printed on the surface of semiconductor layers to construct a TFT device with the top contact and bottom gate structures. To overcome the problem of uniform distribution of applied voltages between electrode centers and edges, we investigated whether the circular arc channel could improve the carrier regulation ability under the field effect in printed TFTs compared with a traditional structure of rectangular symmetry and a rectangular groove channel. The drain current value of the IGZO TFT with a circular arc channel pattern was significantly enhanced compared to that of a TFT with rectangular symmetric source/drain electrodes under the corresponding drain–source voltage and gate voltage. The field effect properties of the device were obviously improved by introducing the arc-shaped channel structure.https://www.mdpi.com/2072-666X/14/11/2121thin film transistorink-jet printingchannel shapeindium gallium zinc oxide
spellingShingle Xingzhen Yan
Bo Li
Yiqiang Zhang
Yanjie Wang
Chao Wang
Yaodan Chi
Xiaotian Yang
Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
Micromachines
thin film transistor
ink-jet printing
channel shape
indium gallium zinc oxide
title Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
title_full Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
title_fullStr Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
title_full_unstemmed Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
title_short Effect of Channel Shape on Performance of Printed Indium Gallium Zinc Oxide Thin-Film Transistors
title_sort effect of channel shape on performance of printed indium gallium zinc oxide thin film transistors
topic thin film transistor
ink-jet printing
channel shape
indium gallium zinc oxide
url https://www.mdpi.com/2072-666X/14/11/2121
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