Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces
In principle, non-contact atomic force microscopy (NC-AFM) now readily allows for the measurement of forces with sub-nanonewton precision on the atomic scale. In practice, however, the extraction of the often desired ‘short-range’ force from the experimental observable (frequency shift) is often far...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2014-04-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.5.45 |