W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples
A novel W-band sensor for complex permittivity measurements of rod shaped samples based on reflectometer method is described. Characterization of dielectric materials around 100 GHz is quite a challenge. The main limitation is the requirements for the accuracy of the dimensions of the test sample an...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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IEEE
2021-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/9508970/ |
| _version_ | 1819131663619194880 |
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| author | Yevhen Yashchyshyn Krzysztof Derzakowski Changying Wu Grzegorz Cywinski |
| author_facet | Yevhen Yashchyshyn Krzysztof Derzakowski Changying Wu Grzegorz Cywinski |
| author_sort | Yevhen Yashchyshyn |
| collection | DOAJ |
| description | A novel W-band sensor for complex permittivity measurements of rod shaped samples based on reflectometer method is described. Characterization of dielectric materials around 100 GHz is quite a challenge. The main limitation is the requirements for the accuracy of the dimensions of the test sample and ensuring good contact with conductive surfaces. From this point of view, it seems interesting to use a cylindrical waveguide with the TE<sub>01</sub> mode. The four linearly-polarized H<sub>10</sub> fields of rectangular waveguides with equal amplitude and phase circumnavigate the cylindrical waveguide to jointly excite its TE<sub>nm</sub> circular modes with four-fold symmetry. This precludes the excitation of lower-order modes of the metallic cylindrical waveguide. TE<sub>01</sub> mode is unique in that its field leads to zero on the surface of the walls of a metallic cylindrical waveguide. The main field interaction takes place on the sample surface. The calibration method uses calibration curves obtained by simulation for known values of complex permittivity of the samples. This eliminates the requirement for a precision calibration standards, which is the problematic to realize at millimeter wavelengths. Moreover, the complex field structure in the sensor makes it impossible to apply a standard calibration method. Simulation and measurements using these method have been performed in W-band (70–114 GHz). Measurement results demonstrate the robustness of this new sensor for characterizing rod shaped dielectric samples. |
| first_indexed | 2024-12-22T09:19:05Z |
| format | Article |
| id | doaj.art-0a97fac93faf4d519db81a6b896d3a7c |
| institution | Directory Open Access Journal |
| issn | 2169-3536 |
| language | English |
| last_indexed | 2024-12-22T09:19:05Z |
| publishDate | 2021-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj.art-0a97fac93faf4d519db81a6b896d3a7c2022-12-21T18:31:14ZengIEEEIEEE Access2169-35362021-01-01911112511113110.1109/ACCESS.2021.31032439508970W-Band Sensor for Complex Permittivity Measurements of Rod Shaped SamplesYevhen Yashchyshyn0https://orcid.org/0000-0001-8378-1399Krzysztof Derzakowski1https://orcid.org/0000-0002-4883-320XChangying Wu2https://orcid.org/0000-0003-2122-9659Grzegorz Cywinski3Institute of Radioelectronics and Multimedia Technology, Warsaw University of Technology, Warsaw, PolandInstitute of Radioelectronics and Multimedia Technology, Warsaw University of Technology, Warsaw, PolandSchool of Electronics and Information, Northwestern Polytechnical University, Xi’an, ChinaCENTERA Laboratories, Institute of High Pressure Physics, Polish Academy of Sciences, Warsaw, PolandA novel W-band sensor for complex permittivity measurements of rod shaped samples based on reflectometer method is described. Characterization of dielectric materials around 100 GHz is quite a challenge. The main limitation is the requirements for the accuracy of the dimensions of the test sample and ensuring good contact with conductive surfaces. From this point of view, it seems interesting to use a cylindrical waveguide with the TE<sub>01</sub> mode. The four linearly-polarized H<sub>10</sub> fields of rectangular waveguides with equal amplitude and phase circumnavigate the cylindrical waveguide to jointly excite its TE<sub>nm</sub> circular modes with four-fold symmetry. This precludes the excitation of lower-order modes of the metallic cylindrical waveguide. TE<sub>01</sub> mode is unique in that its field leads to zero on the surface of the walls of a metallic cylindrical waveguide. The main field interaction takes place on the sample surface. The calibration method uses calibration curves obtained by simulation for known values of complex permittivity of the samples. This eliminates the requirement for a precision calibration standards, which is the problematic to realize at millimeter wavelengths. Moreover, the complex field structure in the sensor makes it impossible to apply a standard calibration method. Simulation and measurements using these method have been performed in W-band (70–114 GHz). Measurement results demonstrate the robustness of this new sensor for characterizing rod shaped dielectric samples.https://ieeexplore.ieee.org/document/9508970/Dielectric materialsdielectric measurementmicrowave and millimeter wave measurementsmicrowave sensorsreflectometry |
| spellingShingle | Yevhen Yashchyshyn Krzysztof Derzakowski Changying Wu Grzegorz Cywinski W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples IEEE Access Dielectric materials dielectric measurement microwave and millimeter wave measurements microwave sensors reflectometry |
| title | W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples |
| title_full | W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples |
| title_fullStr | W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples |
| title_full_unstemmed | W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples |
| title_short | W-Band Sensor for Complex Permittivity Measurements of Rod Shaped Samples |
| title_sort | w band sensor for complex permittivity measurements of rod shaped samples |
| topic | Dielectric materials dielectric measurement microwave and millimeter wave measurements microwave sensors reflectometry |
| url | https://ieeexplore.ieee.org/document/9508970/ |
| work_keys_str_mv | AT yevhenyashchyshyn wbandsensorforcomplexpermittivitymeasurementsofrodshapedsamples AT krzysztofderzakowski wbandsensorforcomplexpermittivitymeasurementsofrodshapedsamples AT changyingwu wbandsensorforcomplexpermittivitymeasurementsofrodshapedsamples AT grzegorzcywinski wbandsensorforcomplexpermittivitymeasurementsofrodshapedsamples |