Visualizing nanometric structures with sub-millimeter waves

The authors demonstrate a far-field approach for height profile measurements with sub-millimetre waves. By evaluating Fabry-Pérot oscillations within surface-structured samples, combined with a Hilbert-transform approach, they visualize structures with a height of 49 nm, with 31 nm precision.

Bibliographic Details
Main Authors: Alonso Ingar Romero, Amlan kusum Mukherjee, Anuar Fernandez Olvera, Mario Méndez Aller, Sascha Preu
Format: Article
Language:English
Published: Nature Portfolio 2021-12-01
Series:Nature Communications
Online Access:https://doi.org/10.1038/s41467-021-27264-x
Description
Summary:The authors demonstrate a far-field approach for height profile measurements with sub-millimetre waves. By evaluating Fabry-Pérot oscillations within surface-structured samples, combined with a Hilbert-transform approach, they visualize structures with a height of 49 nm, with 31 nm precision.
ISSN:2041-1723