Evaluation of Low Dose Silicon Carbide Temperature Monitors

Thermocouples are generally used to provide real-time temperature indications in instrumented tests performed at materials and test reactors. Melt wires or paint spots are often included in such tests as an independent technique of detecting peak temperatures incurred during irradiation. In addition...

Full description

Bibliographic Details
Main Authors: Davis K. L., Gusarov A., Unruh T. C., Calderoni P., Heidrich B.J., Verner K. M., Al Rashdan A., Lambson A. A., Van Dyck S., Uytdenhouwen I.
Format: Article
Language:English
Published: EDP Sciences 2020-01-01
Series:EPJ Web of Conferences
Subjects:
Online Access:https://www.epj-conferences.org/articles/epjconf/pdf/2020/01/epjconf_animma2019_04002.pdf
_version_ 1818559590508265472
author Davis K. L.
Gusarov A.
Unruh T. C.
Calderoni P.
Heidrich B.J.
Verner K. M.
Al Rashdan A.
Lambson A. A.
Van Dyck S.
Uytdenhouwen I.
author_facet Davis K. L.
Gusarov A.
Unruh T. C.
Calderoni P.
Heidrich B.J.
Verner K. M.
Al Rashdan A.
Lambson A. A.
Van Dyck S.
Uytdenhouwen I.
author_sort Davis K. L.
collection DOAJ
description Thermocouples are generally used to provide real-time temperature indications in instrumented tests performed at materials and test reactors. Melt wires or paint spots are often included in such tests as an independent technique of detecting peak temperatures incurred during irradiation. In addition, less expensive static capsule tests, which have no leads attached for real-time data transmission, often rely on melt wires and paint spots as a post-irradiation technique for peak temperature indication. Unfortunately, these techniques are limited in that they can only detect whether a single temperature is or is not exceeded. Silicon carbide (SiC) monitors are advantageous because a single monitor can be used to determine the peak temperature reached within a relatively broad range (200 – 800°C). Although the use of SiC monitors was proposed more than five decades ago, the ultimate performance limits of this technique are not fully understood. The Nuclear Science User Facilities (NSUF) is the United States Department of Energy Office of Nuclear Energy's only designated nuclear energy user facility. Its mission is to provide nuclear energy researchers access to world-class capabilities and to facilitate the advancement of nuclear science and technology. This mission is supported by providing access to state-of-the-art experimental irradiation testing, post irradiation examination facilities, and high performance computing capabilities as well as technical and scientific assistance for the design and execution of projects. As part of an NSUF project, low dose silicon carbide monitors were irradiated in the Belgian Reactor 2 and were then evaluated both at the SCK•CEN and at Idaho National Laboratory’s High Temperature Test Laboratory to determine their peak temperature achieved during irradiation. The technical significance of this work was that the monitors were irradiated to a dose that was significantly less than recommended in published literature. This paper will discuss the evaluation process, the irradiation test, and the performance of the low dose silicon carbide temperature monitors.
first_indexed 2024-12-14T00:27:31Z
format Article
id doaj.art-0df087b5ed8748f9a35f285ac820a2ca
institution Directory Open Access Journal
issn 2100-014X
language English
last_indexed 2024-12-14T00:27:31Z
publishDate 2020-01-01
publisher EDP Sciences
record_format Article
series EPJ Web of Conferences
spelling doaj.art-0df087b5ed8748f9a35f285ac820a2ca2022-12-21T23:24:59ZengEDP SciencesEPJ Web of Conferences2100-014X2020-01-012250400210.1051/epjconf/202022504002epjconf_animma2019_04002Evaluation of Low Dose Silicon Carbide Temperature MonitorsDavis K. L.Gusarov A.Unruh T. C.Calderoni P.Heidrich B.J.Verner K. M.Al Rashdan A.Lambson A. A.Van Dyck S.Uytdenhouwen I.Thermocouples are generally used to provide real-time temperature indications in instrumented tests performed at materials and test reactors. Melt wires or paint spots are often included in such tests as an independent technique of detecting peak temperatures incurred during irradiation. In addition, less expensive static capsule tests, which have no leads attached for real-time data transmission, often rely on melt wires and paint spots as a post-irradiation technique for peak temperature indication. Unfortunately, these techniques are limited in that they can only detect whether a single temperature is or is not exceeded. Silicon carbide (SiC) monitors are advantageous because a single monitor can be used to determine the peak temperature reached within a relatively broad range (200 – 800°C). Although the use of SiC monitors was proposed more than five decades ago, the ultimate performance limits of this technique are not fully understood. The Nuclear Science User Facilities (NSUF) is the United States Department of Energy Office of Nuclear Energy's only designated nuclear energy user facility. Its mission is to provide nuclear energy researchers access to world-class capabilities and to facilitate the advancement of nuclear science and technology. This mission is supported by providing access to state-of-the-art experimental irradiation testing, post irradiation examination facilities, and high performance computing capabilities as well as technical and scientific assistance for the design and execution of projects. As part of an NSUF project, low dose silicon carbide monitors were irradiated in the Belgian Reactor 2 and were then evaluated both at the SCK•CEN and at Idaho National Laboratory’s High Temperature Test Laboratory to determine their peak temperature achieved during irradiation. The technical significance of this work was that the monitors were irradiated to a dose that was significantly less than recommended in published literature. This paper will discuss the evaluation process, the irradiation test, and the performance of the low dose silicon carbide temperature monitors.https://www.epj-conferences.org/articles/epjconf/pdf/2020/01/epjconf_animma2019_04002.pdfin-pile instrumentationtemperature sensor
spellingShingle Davis K. L.
Gusarov A.
Unruh T. C.
Calderoni P.
Heidrich B.J.
Verner K. M.
Al Rashdan A.
Lambson A. A.
Van Dyck S.
Uytdenhouwen I.
Evaluation of Low Dose Silicon Carbide Temperature Monitors
EPJ Web of Conferences
in-pile instrumentation
temperature sensor
title Evaluation of Low Dose Silicon Carbide Temperature Monitors
title_full Evaluation of Low Dose Silicon Carbide Temperature Monitors
title_fullStr Evaluation of Low Dose Silicon Carbide Temperature Monitors
title_full_unstemmed Evaluation of Low Dose Silicon Carbide Temperature Monitors
title_short Evaluation of Low Dose Silicon Carbide Temperature Monitors
title_sort evaluation of low dose silicon carbide temperature monitors
topic in-pile instrumentation
temperature sensor
url https://www.epj-conferences.org/articles/epjconf/pdf/2020/01/epjconf_animma2019_04002.pdf
work_keys_str_mv AT daviskl evaluationoflowdosesiliconcarbidetemperaturemonitors
AT gusarova evaluationoflowdosesiliconcarbidetemperaturemonitors
AT unruhtc evaluationoflowdosesiliconcarbidetemperaturemonitors
AT calderonip evaluationoflowdosesiliconcarbidetemperaturemonitors
AT heidrichbj evaluationoflowdosesiliconcarbidetemperaturemonitors
AT vernerkm evaluationoflowdosesiliconcarbidetemperaturemonitors
AT alrashdana evaluationoflowdosesiliconcarbidetemperaturemonitors
AT lambsonaa evaluationoflowdosesiliconcarbidetemperaturemonitors
AT vandycks evaluationoflowdosesiliconcarbidetemperaturemonitors
AT uytdenhouweni evaluationoflowdosesiliconcarbidetemperaturemonitors