Transverse ultrafast laser inscription in bulk silicon

In-volume ultrafast laser direct writing of silicon is generally limited by strong nonlinear propagation effects preventing the production of modifications. By using advantageous spectral, temporal, and spatial conditions, we demonstrate that modifications can be repeatably produced inside silicon....

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Main Authors: M. Chambonneau, M. Blothe, Q. Li, V. Yu. Fedorov, T. Heuermann, M. Gebhardt, C. Gaida, S. Tertelmann, F. Sotier, J. Limpert, S. Tzortzakis, S. Nolte
Format: Article
Language:English
Published: American Physical Society 2021-10-01
Series:Physical Review Research
Online Access:http://doi.org/10.1103/PhysRevResearch.3.043037
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author M. Chambonneau
M. Blothe
Q. Li
V. Yu. Fedorov
T. Heuermann
M. Gebhardt
C. Gaida
S. Tertelmann
F. Sotier
J. Limpert
S. Tzortzakis
S. Nolte
author_facet M. Chambonneau
M. Blothe
Q. Li
V. Yu. Fedorov
T. Heuermann
M. Gebhardt
C. Gaida
S. Tertelmann
F. Sotier
J. Limpert
S. Tzortzakis
S. Nolte
author_sort M. Chambonneau
collection DOAJ
description In-volume ultrafast laser direct writing of silicon is generally limited by strong nonlinear propagation effects preventing the production of modifications. By using advantageous spectral, temporal, and spatial conditions, we demonstrate that modifications can be repeatably produced inside silicon. Our approach relies on irradiation at ≈2 μm wavelength with temporally distorted femtosecond pulses. These pulses are focused in a way that spherical aberrations of different origins mutually balance, as predicted by point spread function analyses and in good agreement with nonlinear propagation simulations. We also establish the laws governing modification growth on a pulse-to-pulse basis, which allows us to demonstrate transverse inscription inside silicon with various line morphologies depending on the irradiation conditions. We finally show that the production of single-pulse repeatable modifications is a necessary condition for reliable transverse inscription inside silicon.
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spelling doaj.art-0e0dbaf52d0c498db63a2f5e77a19aad2024-04-12T17:14:50ZengAmerican Physical SocietyPhysical Review Research2643-15642021-10-013404303710.1103/PhysRevResearch.3.043037Transverse ultrafast laser inscription in bulk siliconM. ChambonneauM. BlotheQ. LiV. Yu. FedorovT. HeuermannM. GebhardtC. GaidaS. TertelmannF. SotierJ. LimpertS. TzortzakisS. NolteIn-volume ultrafast laser direct writing of silicon is generally limited by strong nonlinear propagation effects preventing the production of modifications. By using advantageous spectral, temporal, and spatial conditions, we demonstrate that modifications can be repeatably produced inside silicon. Our approach relies on irradiation at ≈2 μm wavelength with temporally distorted femtosecond pulses. These pulses are focused in a way that spherical aberrations of different origins mutually balance, as predicted by point spread function analyses and in good agreement with nonlinear propagation simulations. We also establish the laws governing modification growth on a pulse-to-pulse basis, which allows us to demonstrate transverse inscription inside silicon with various line morphologies depending on the irradiation conditions. We finally show that the production of single-pulse repeatable modifications is a necessary condition for reliable transverse inscription inside silicon.http://doi.org/10.1103/PhysRevResearch.3.043037
spellingShingle M. Chambonneau
M. Blothe
Q. Li
V. Yu. Fedorov
T. Heuermann
M. Gebhardt
C. Gaida
S. Tertelmann
F. Sotier
J. Limpert
S. Tzortzakis
S. Nolte
Transverse ultrafast laser inscription in bulk silicon
Physical Review Research
title Transverse ultrafast laser inscription in bulk silicon
title_full Transverse ultrafast laser inscription in bulk silicon
title_fullStr Transverse ultrafast laser inscription in bulk silicon
title_full_unstemmed Transverse ultrafast laser inscription in bulk silicon
title_short Transverse ultrafast laser inscription in bulk silicon
title_sort transverse ultrafast laser inscription in bulk silicon
url http://doi.org/10.1103/PhysRevResearch.3.043037
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