Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine
The amplifier is a key component of the radio frequency (RF) front-end, and its specifications directly determine the performance of the system in which it is located. Unfortunately, amplifiers’ specifications degrade with temperature and even lead to system failure. To study how the system failure...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-04-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/13/5/693 |
| _version_ | 1797497750467641344 |
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| author | Shaohua Zhou Cheng Yang Jian Wang |
| author_facet | Shaohua Zhou Cheng Yang Jian Wang |
| author_sort | Shaohua Zhou |
| collection | DOAJ |
| description | The amplifier is a key component of the radio frequency (RF) front-end, and its specifications directly determine the performance of the system in which it is located. Unfortunately, amplifiers’ specifications degrade with temperature and even lead to system failure. To study how the system failure is affected by the amplifier specification degradation, it is necessary to couple the amplifier specification degradation into the system optimization design. Furthermore, to couple the amplifier specification degradation into the optimal design of the system, it is necessary to model the characteristics of the amplifier specification change with temperature. In this paper, the temperature characteristics of two amplifiers are modeled using an extreme learning machine (ELM), and the results show that the model agrees well with the measurement results and can effectively reduce measurement time and cost. |
| first_indexed | 2024-03-10T03:23:43Z |
| format | Article |
| id | doaj.art-0e794885431e497aa70e7ce704a6876d |
| institution | Directory Open Access Journal |
| issn | 2072-666X |
| language | English |
| last_indexed | 2024-03-10T03:23:43Z |
| publishDate | 2022-04-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Micromachines |
| spelling | doaj.art-0e794885431e497aa70e7ce704a6876d2023-11-23T12:11:41ZengMDPI AGMicromachines2072-666X2022-04-0113569310.3390/mi13050693Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning MachineShaohua Zhou0Cheng Yang1Jian Wang2School of Microelectronics, Tianjin University, Tianjin 300072, ChinaSchool of Microelectronics, Tianjin University, Tianjin 300072, ChinaSchool of Microelectronics, Tianjin University, Tianjin 300072, ChinaThe amplifier is a key component of the radio frequency (RF) front-end, and its specifications directly determine the performance of the system in which it is located. Unfortunately, amplifiers’ specifications degrade with temperature and even lead to system failure. To study how the system failure is affected by the amplifier specification degradation, it is necessary to couple the amplifier specification degradation into the system optimization design. Furthermore, to couple the amplifier specification degradation into the optimal design of the system, it is necessary to model the characteristics of the amplifier specification change with temperature. In this paper, the temperature characteristics of two amplifiers are modeled using an extreme learning machine (ELM), and the results show that the model agrees well with the measurement results and can effectively reduce measurement time and cost.https://www.mdpi.com/2072-666X/13/5/693RF amplifiertemperature characteristicsmodelingELM |
| spellingShingle | Shaohua Zhou Cheng Yang Jian Wang Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine Micromachines RF amplifier temperature characteristics modeling ELM |
| title | Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine |
| title_full | Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine |
| title_fullStr | Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine |
| title_full_unstemmed | Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine |
| title_short | Modeling of Key Specifications for RF Amplifiers Using the Extreme Learning Machine |
| title_sort | modeling of key specifications for rf amplifiers using the extreme learning machine |
| topic | RF amplifier temperature characteristics modeling ELM |
| url | https://www.mdpi.com/2072-666X/13/5/693 |
| work_keys_str_mv | AT shaohuazhou modelingofkeyspecificationsforrfamplifiersusingtheextremelearningmachine AT chengyang modelingofkeyspecificationsforrfamplifiersusingtheextremelearningmachine AT jianwang modelingofkeyspecificationsforrfamplifiersusingtheextremelearningmachine |