Multi-release software model based on testing coverage incorporating random effect (SDE)

Multi-release software model based on testing coverage incorporating random effect (SDE)

In the past, various Software Reliability Growth Models (SRGMs) have been proposed using different parameters to improve software worthiness. Testing Coverage is one such parameter that has been studied in numerous models of software in the past and it has proved its influence on the reliability mod...

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Bibliographic Details
Main Authors: Ritu Bibyan, Sameer Anand, Anu G. Aggarwal, Gurjeet Kaur
Format: Article
Language:English
Published: Elsevier 2023-01-01
Series:MethodsX
Subjects:
Testing Coverage incorporating SDE with Multi Release SRGM
Online Access:http://www.sciencedirect.com/science/article/pii/S2215016123000791

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