InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation

This paper reports an InAs/InAsSb strained-layer superlattice (SLS) mid-wavelength infrared detector and a focal plane array particularly suited for high-temperature operation. Utilizing the <i>n</i>B<i>n</i> architecture, the detector structure was grown by molecular beam ep...

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Main Authors: Gamini Ariyawansa, Joshua Duran, Charles Reyner, John Scheihing
Format: Article
Language:English
Published: MDPI AG 2019-11-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/10/12/806
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author Gamini Ariyawansa
Joshua Duran
Charles Reyner
John Scheihing
author_facet Gamini Ariyawansa
Joshua Duran
Charles Reyner
John Scheihing
author_sort Gamini Ariyawansa
collection DOAJ
description This paper reports an InAs/InAsSb strained-layer superlattice (SLS) mid-wavelength infrared detector and a focal plane array particularly suited for high-temperature operation. Utilizing the <i>n</i>B<i>n</i> architecture, the detector structure was grown by molecular beam epitaxy and consists of a 5.5 &#181;m thick <i>n</i>-type SLS as the infrared-absorbing element. Through detailed characterization, it was found that the detector exhibits a cut-off wavelength of 5.5 um, a peak external quantum efficiency (without anti-reflection coating) of 56%, and a dark current of 3.4 &#215; 10<sup>-4</sup> A/cm<sup>2</sup>, which is a factor of 9 times Rule 07, at 160 K temperature. It was also found that the quantum efficiency increases with temperature and reaches ~56% at 140 K, which is probably due to the diffusion length being shorter than the absorber thickness at temperatures below 140 K. A 320 &#215; 256 focal plane array was also fabricated and tested, revealing noise equivalent temperature difference of ~10 mK at 80 K with f/2.3 optics and 3 ms integration time. The overall performance indicates that these SLS detectors have the potential to reach the performance comparable to InSb detectors at temperatures higher than 80 K, enabling high-temperature operation.
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spelling doaj.art-0ed1fc1b0a9d48408ddcfddb61ee55992022-12-21T17:32:38ZengMDPI AGMicromachines2072-666X2019-11-01101280610.3390/mi10120806mi10120806InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature OperationGamini Ariyawansa0Joshua Duran1Charles Reyner2John Scheihing3Air Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, OH 45433, USAAir Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, OH 45433, USAAir Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, OH 45433, USAAir Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, OH 45433, USAThis paper reports an InAs/InAsSb strained-layer superlattice (SLS) mid-wavelength infrared detector and a focal plane array particularly suited for high-temperature operation. Utilizing the <i>n</i>B<i>n</i> architecture, the detector structure was grown by molecular beam epitaxy and consists of a 5.5 &#181;m thick <i>n</i>-type SLS as the infrared-absorbing element. Through detailed characterization, it was found that the detector exhibits a cut-off wavelength of 5.5 um, a peak external quantum efficiency (without anti-reflection coating) of 56%, and a dark current of 3.4 &#215; 10<sup>-4</sup> A/cm<sup>2</sup>, which is a factor of 9 times Rule 07, at 160 K temperature. It was also found that the quantum efficiency increases with temperature and reaches ~56% at 140 K, which is probably due to the diffusion length being shorter than the absorber thickness at temperatures below 140 K. A 320 &#215; 256 focal plane array was also fabricated and tested, revealing noise equivalent temperature difference of ~10 mK at 80 K with f/2.3 optics and 3 ms integration time. The overall performance indicates that these SLS detectors have the potential to reach the performance comparable to InSb detectors at temperatures higher than 80 K, enabling high-temperature operation.https://www.mdpi.com/2072-666X/10/12/806infrared detectorstrained layer superlatticeinas/inassbabsorption coefficientbarrier detectorhigh operating temperature
spellingShingle Gamini Ariyawansa
Joshua Duran
Charles Reyner
John Scheihing
InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
Micromachines
infrared detector
strained layer superlattice
inas/inassb
absorption coefficient
barrier detector
high operating temperature
title InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
title_full InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
title_fullStr InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
title_full_unstemmed InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
title_short InAs/InAsSb Strained-Layer Superlattice Mid-Wavelength Infrared Detector for High-Temperature Operation
title_sort inas inassb strained layer superlattice mid wavelength infrared detector for high temperature operation
topic infrared detector
strained layer superlattice
inas/inassb
absorption coefficient
barrier detector
high operating temperature
url https://www.mdpi.com/2072-666X/10/12/806
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AT charlesreyner inasinassbstrainedlayersuperlatticemidwavelengthinfrareddetectorforhightemperatureoperation
AT johnscheihing inasinassbstrainedlayersuperlatticemidwavelengthinfrareddetectorforhightemperatureoperation