Distribution Density-Aware Compensation for High-Resolution Stretchable Display

When a stretchable display is stretched, the area of the exposed substrate between the light-emitting diodes (LEDs) increases, decreasing the image luminance. Currently, this problem is not addressed in existing high-resolution display systems. Although the mean-based method and gamma correction met...

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Bibliographic Details
Main Authors: Sung-Hoon Jung, Jung-Hyun Kim, Suk-Ju Kang
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9819901/
Description
Summary:When a stretchable display is stretched, the area of the exposed substrate between the light-emitting diodes (LEDs) increases, decreasing the image luminance. Currently, this problem is not addressed in existing high-resolution display systems. Although the mean-based method and gamma correction method using general image processing techniques, which are first presented in this paper, can compensate for the decrease in luminance, these methods cannot be adaptively applied for stretchable display systems. Therefore, this paper proposes a novel image compensation method optimized for stretchable displays. The proposed distribution density-aware method (DDAM) compensates for the decrease in luminance particularly for the area involving the newly exposed substrate. The DDAM solves the saturation problem associated with the mean-based method and the problem of inaccurate luminance estimation associated with the gamma correction method. Compared with the mean-based method and the gamma correction method, the peak signal-to-noise ratio of the DDAM is 0.600 dB and 1.977 dB higher, respectively. The structural similarity index measure is also 0.055 and 0.057 higher, respectively. In addition, we develop a novel simulator to evaluate the stretching of high-pixel-per-inch displays, which are being actively researched, and use it to verify the performance of above mentioned luminance reduction compensation methods.
ISSN:2169-3536